Protocol Test
See Also: Protocol Analyzers
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Product
Medium-size Reverberation Chamber
E-Series
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The E medium-size multicavity Reverberation Chamber Series represents that state-of-the-art in reverberation chamber technology. The E-Series can make single measurements, batch tests, protocols or campaign tests for different frequency bands, different technologies and different channel models, running overnight without human intervention. Embedded frequency-, mode-, source- and platform-stirring in a double-shielded set of cavities allow Passive MIMO (Efficiency, Correlation, Diversity Gain, MIMO Capacity and others), Active MIMO OTA (TRP, TIS, TPUT, MTS, CQI, M2TxDT, RSRP, MCL and others) and Time-Domain MIMO (DL/UL TCP/UDP TPUT, RMS DS, STD, PL, CBW, Mute%, eNodeB, VDT-OTA) measurements up to 8x8 and 8DLCC to be performed for antennas and devices up to 50cm and 50kg ranging from 2G to 4G, covering all available cellular and wireless technologies to date, including wearables devices, sound acoustic mute, WLAN and W-IoT testing. There is no RC in the market more advanced than the E-Series.
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Product
1-2 Independent, Dual Redundant 1553 Channels on Small Mezzanine
MEZ-E1553
Ethernet Interface
From our popular ENET product, the MEZ-E1553 is a small, rugged mezzanine product that can easily be integrated into your system design. Alta provides full reference schematics, design notes, STEP 3-D Files, and sample ESS test programs. Guaranteed 1553A/B/C compliant with AS4111 5.2 Protocol Test reports.
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Product
PCIe 6.0 Protocol Analyzer
P5570A
Protocol Analyzer
Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test
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Product
MIPI M-PHY Protocol Analyzer
U4431U
Protocol Analyzer
Power to meet the needs of today’s and tomorrow’s designs Up to Gear 3 HS data rates Up to 16 GB trace depth Up to 4 data lanes Complete insight into complex designs Track multiple M-PHY busses from the PHY to the application layer Raw Mode 8b/10b data views Infiniium Oscilloscope integration Powerful interface that allows unlimited customization of system views
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Product
PCIe 3.0 Protocol Analyzer
Summit T34
Protocol Analyzer
The Teledyne LeCroy Summit T34 PCI Express protocol analyzer is designed for PCIe storage, add-in card and embedded application developers. It supports x1 to x4 lane widths with the capability of expanding to x8 with two boxes connected together, and deep buffer memory that is expandable from 4GB to 64GB ideal for storage analysis, the Summit T34 provides unmatched capability and flexibility for developers and users of advanced PCI Express products. Teledyne LeCroy has been the leader in NVM Express and SATA Express protocol analysis since 2010. This storage analyzer incorporates all of these powerful legacy features and adds the latest in storage queuing performance analysis.
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Product
PCI Express (PCIe) 5.0 and Compute Express Link (CXL) Protocol Analyzer
Summit T516
Protocol Analyzer
The Summit T516 is targeted at high-speed PCI Express 5.0 and CXL I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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Product
48G Protocol Analyzer / Generator
980
Protocol Analyzer
The 980 48G HDMI module is a feature rich HDMI 2.1a video analyzer and video generator for test any HDMI product or device. The instrument’s HDMI Rx analyzer port provides deep analysis capabilities for HDMI 2.1a Fixed Rate Link (FRL) with Forward Error Correction (FEC) up to 48Gbps (12Gbps/Channel). The analyzer port provides visibility into the Fixed Rate Link packetization—FRL packets, Character blocks and Super blocks. The instrument also supports analysis of the FRL link training functions of a receiver in the FRL mode in both 3 lane and 4 lane configurations to test a source's FRL link training function. Analysis of Display Stream Compression (DSC) is also supported.
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Product
PCIe 2.0 Protocol Analyzer
Summit T28
Protocol Analyzer
The Teledyne LeCroy Summit T28 PCI Express analyzer is for customers developing PCIe 1.0 or 2.0 x8 lane width server, workstation, desktop, graphics, storage, and network card applications.
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Product
Test Workflow Standard
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
PCIe 4.0 Protocol Analyzer
Summit T48
Protocol Analyzer
Teledyne LeCroy’s Summit™ T48 joins the Summit™ T416 as the second protocol analyzer to be released in its family of tools supporting the PCIe 4.0 architecture. The new Summit™ T48 protocol analyzer based on the PCIe 4.0 specification supports up to 16GT/s and up to x8 lane width for protocol analysis. Companies that are interested in testing PCIe 4.0 based I/O cards such as Storage Controllers, Ethernet, Fibre Channel, Infiniband, and others will now be able to get all of the protocol analyzer debugging features they need, while being able to better manage their costs. SSD storage applications will also benefit from the integrated support for SSD bus protocols such as PCIe/ NVMe/ SMBus/ NVMe-MI/ TCG and others. When combined with Teledyne LeCroy’s Summit™ Z416 protocol exerciser, the Summit™ T48 will provide a deeper understanding of test results on a variety of test configurations. Teledyne LeCroy’s wide range of high speed interposers and probes provide full flexibility and connectivity to CEM and other form factor sockets on system boards as well as solder down and mid-bus probes.
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Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Product
USB 2.0 Protocol Analyzer
Mercury T2
Protocol Analyzer
The Mercury T2 is the industry's smallest, most affordable hardware-based USB 2.0 protocol analyzer that combines the defacto standard CATC Trace display with powerful analysis features. The pocket-sized Mercury T2 is bus powered and is controlled using any Windows PC. With comprehensive triggering, the Mercury T2 provides much of the same lab quality protocol analysis capabilities offered in Teledyne LeCroy's top-of-the-line USB analyzers.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
SAS 4.0 Protocol Analyzer/Jamer/Exerciser System
Sierra M244
Protocol Analyzer
The Teledyne LeCroy Sierra M244 is the industry’s first SAS 4.0 protocol analyzer / jammer / exerciser system for testing next generation storage systems, devices and software.
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
Bottom Electrode SMD Test Fixture
16197A
Test Fixture
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
Test Module
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
