Protocol Test
See Also: Protocol Analyzers
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8 CANBus Channels, CAN 2.0 A/B Protocol or J1939 Protocol
CB3
The serial bus system with real-time capabilities is the subject of the ISO 11898 International Standard and covers the lowest two layers of the ISO/OSI Reference Model. Our CANBus modules provide independent, isolated channels of CAN serial data bus links, conforming to the ISO 11898 International Standard. All CAN nodes are able to transmit data and several CAN nodes can request the bus simultaneously.
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PXI Functional Test System
U8989A
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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DDR4 Protocol Debug And Analysis Solution
U4972A
The U4972A DDR4 DRAM bundle provides software applications, probing, and hardware options for DDR4 DRAM debug, compliance validation, and analysis. The U4972A bundle includes systemization of hardware (modules installed into chassis) and software loaded onto the M9537A controller.
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Protocol Converter
MACC2
When designing or upgrading avionics systems we are often faced with the task of integrating components that were not originally designed to work together.A control computer that communicates using RS-232 may need to control component that expects MIL-STD-1553 messages or an INS may put out ARINC-429 labels, which are needed by Multi function Display designed around RS-422.Faced with problems like these, integrators must choose between two poor options. They must either give up on one of the units in favor of another unit that may be less suitable but uses the appropriate communications spec; or they must add a computer system – often PC104 – which can translate from one unit to the other. These computers are generally large, heavy, hot, and require substantial power.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Protocol Intelligent Pressure Transmitter
HR3288Hart
HighReach Measuring & Controlling System Co.,Ltd
The HR3288 HART protocol intelligent pressure transmitter is a high-precision, high-stability, multi-parameter, 4-position, half-LCD display intelligent pressure measurement product that complies with the HART protocol. Users can use the HART communicator to manage, adjust Or monitor process variables for HART instruments running in the process, or use the buttons for on-site configuration, which is easy to operate.This product adopts the latest application results of digital technology in the field of sensor manufacturing, combined with the most advanced pressure transmitter design and manufacturing technology, precision digital temperature compensation and nonlinear correction technology, safe and reliable explosion-proof structure design and standardized signal output , precision high, wide range coverage, suitable for places where precise measurement of fluid pressure is required.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Multi Protocol Boards
The EXC-4000 carrier board series was developed to meet the needs of avionic testers for multi-protocol integrated, digital bus testing. Modules may be selected out of a growing list which currently includes MIL-STD-1553/1760, MMSI, H009, ARINC-429, ARINC-708/453, Serial (232/422/485), Discrete and CAN bus. Additionally, an IRIG B decoder implements a global time stamp relative to the IRIG B pulses. The need for higher density, different protocols, and multi-channel on one integrated test card has made the EXC-4000 series very successful.
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PCIe 3.0 Protocol Analyzer
Summit T34
The Teledyne LeCroy Summit T34 PCI Express protocol analyzer is designed for PCIe storage, add-in card and embedded application developers. It supports x1 to x4 lane widths with the capability of expanding to x8 with two boxes connected together, and deep buffer memory that is expandable from 4GB to 64GB ideal for storage analysis, the Summit T34 provides unmatched capability and flexibility for developers and users of advanced PCI Express products. Teledyne LeCroy has been the leader in NVM Express and SATA Express protocol analysis since 2010. This storage analyzer incorporates all of these powerful legacy features and adds the latest in storage queuing performance analysis.
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CSI & DSI Protocol Generator
Envision X84 CSI&DSI
With comprehensive support for MIPI CSI-2v2 and DSI-2 specifications, Teledyne LeCroy’s Envision X84 generator platform provides the industry’s most accurate and reliable generation of MIPI camera and display protocols for fast debug, analysis and problem solving. The Envision X84 exerciser is loaded with innovative features that help uncover elusive protocol errors and is the intelligent choice for any camera and display validation needs. Using the same hardware platform as the Envision X84 C/D-PHY protocol analyzer, the Envision X84 offers the most flexible solution for MIPI Camera and Display validation and debug.
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SPMI Protocol Analyzer and Exerciser
PGY-SPMI-EX-PD
Prodigy Technovations Pvt. Ltd.
SPMI Protocol Analyzer (PGY-SPMI-EX-PD) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. SPMI (System Power Management Interface) is a MIPI (Mobile Industry Processor Interface) standard with 2-wire synchronous serial, bidirectional interface that connects the integrated Power Controller(PC) of a System on- Chip (SoC) processor system with one or more Power Management Integrated Circuits (PMIC) voltage regulation systems.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Mixed Protocol Modules
The ANET-MxAy offers mixed protocol support, combining MIL-STD-1553 and ARINC429 data bus test and simulation capabilities in one ANET device.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Network Emulator and Protocol Tester
Maxwell Pro
The Maxwell Pro Network Emulator helps engineers learn how their products will perform in mobile, cloud, and WAN networks. By capturing and changing network flows, Maxwell Pro can induce the conditions that cause network congestion, slow links, time outs, Lossy networks (LLNs), and many other adverse network conditions. Engineers can then see the effects on the device or application to find and fix bugs, solve network problems, and learn the limits of device and application performance.
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Test Sets For Diagnostic Testing
Test Sets For Diagnostic Testing are designed to test Oil Resistivity, Tan Delta, High Voltage Surge Comparison, etc. These test sets are automated instruments used to measure electrical features to insulate transformer oil, liquids and varied other insulating materials. They are ideal for revealing different localized problems and varied weak spots in the insulation. These modern testing sets are designed to provide high accuracy in results. In addition to this, they are easy to maintain testing sets available to ensure accurate readings.
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Serial Protocol Host Adapter
SPI Storm
This is the primary step for using SPI Storm device. It consists in describing how you would like to access your serial device: whether you would like to write to your device, read from it or do both simultaneously
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3-in-1 Analyzer: Logic Analyzer, Protocol Analyzer, Simple DSO
MSO2216B
3-in-1 Analyzer : Logic Analyzer, Protocol Analyzer, Simple DSO• PC-based, USB3.0 interface• 8 / 16 Channels(display digital and analog waveforms of the same channel)• Digital Inputs : 2 GHz Timing, 200MHz State Analysis (Max.)• Analog Inputs : 200 MS/s (Max.), Bandwidth 40 MHz• 8 Gb Memory (Max.)• PC RAM storage for streaming mode• Utility model patent of Taiwan number M601827
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Power System Recorder with CDR , PMU and IEC 61850 station bus protocol
TESLA 4000
ERLPhase Power Technologies Ltd
The new TESLA 4000 is an intelligent, state of the art, user-friendly multi-timeframe dynamic power system recorder with advanced Phasor Measurement Unit (PMU) and Continuous Disturbance Recording (CDR) capabilities. Wide area swing recording accomodates system performance analysis in minutes Meets NERC continuous disturbance recording standards with non-volatile on board flash memory No mechanical moving parts – flash drive eliminates most common mode of failure in recorders. Each flash drive holds 1000 records. IEEE C37.118-2005 SynchroPhasor Standard
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Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Test Automation System for Emission Testing
STARS VETS
STARS VETS is a Vehicle Emission Test System application available with the STARS Automation platform for chassis, engine and powertrain dynamometers. The application provides test cycle execution, emissions equipment control, results calculation and reporting in compliance with the different legislative standards throughout the global regions. Its flexible design offers a wide range a customization, and it addresses the various requirements for R&D, COP and certification testing.
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Leak Testing
T SERIES
The new T series marks the evolution of the leak testers for the industry. A touch of innovation that fosters man-machine interaction thanks to the innovative tempered glass touch capacitive panel and other technological innovations that make the range, the natural evolution of the previous M series, the new benchmark for testing and proof brought.
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Modular Testing
Modular testing requirements come in all shapes and sizes. It is therefore important that we are able to match your requirement with a suitable ATE System. At ATE Solutions, we have a range of modular test and test automation products to choose from, with a tester to suit every situation.
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Test Automation
TetraMAX®
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
