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MOSFET
Metal Oxide Semiconductor Field Effect Transistor
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Unclamped Inductive Load Tester
ITC55300C
Model ITC55300C performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.
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PathWave IC-CAP BSIM4 Model Extraction Package
W7025E
The W7025E PathWave IC-CAP BSIM4 Model Extraction Package provides measurement and extraction procedures for the BSIM4 industry-standard model for MOSFET devices.
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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DCDC
DPS/DPD Series
The DPS/DPD is an economically priced series of miniature DC/DC converters offering both single and dual outputs. These unregulated converters offer the latest in MOSFET technology. Featuring efficiencies to 80% and a calculated MTBF in excess of 1,000,000 hours. Additional features include an operating temperature range of -25°C to +71°C with no derating and a LC input filter to reduce the reflected ripple. All this in a package measuring 1.1” x 1.1” x 0.5” high make these converters ideally suited for 0.75” cardspacing.
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Atlas DCA Pro Advanced Semiconductor Analyser
DCA75
The DCA75 is a great instrument for identifying and testing a wide variety of semiconductor components. Just connect any way round! The DCA75 will perform the following:*Display component type (such as N-CH MOSFET, darlington transistor etc).*Display component pinout (such as drain, source, gate etc).*Display detailed parameter measurement.*Plot characteristics curves on your PC.
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Wide Bandgap Transistors
The key for the next essential step towards a more energy-efficient world lies in the use of new materials, such as wide bandgap semiconductors (WBG) which allow for increased power efficiency, smaller size, lighter weight, lower system cost or all of these together. STMicroelectronics offers the broadest product and technology portfolio of silicon carbide (MOSFETs) and gallium-nitride-based (e-mode HEMT) devices, covering bare dies, discretes and modules belonging to the STPOWER family.
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Atlas DCA Semiconductor Analyser
DCA55
Intelligent and flexible semiconductor analyser. Connect any way round! The DCA55 then displays the following on its backlit alphanumeric display:- Component type (such as NPN transistor, P-Ch MOSFET, LED, diode etc)- Pinout information (such as Base, Emitter, Collector etc)- Parameter measurement (hFE, Vbe, Vf, leakage current etc)
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DrMOS (Driver + FET)
Renesas' high-performance DrMOS power modules combine a high-performance FET driver and MOSFETs in an advanced package to create high-density DC/DC converters.
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Medium- to High-Power DC Load ISSRs
Part No. S75DC150
Your product description goes here.Series S75 relays switch medium- to high-power DC loads. These devices feature the latest-generation MOSFET technology as well as an innovative isolated driver to ensure fast power turn on and off. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.Available options include:S75DC150 150A, 0-42 Vdc Load; 4.5-32 Vdc Control
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General Purpose Low-side MOSFET Drivers
Renesas' family of low-side FET drivers are very high-speed matched dual-drivers capable of delivering peak currents of 2.0 amps into highly capacitive loads and excellent at driving large capacitive loads with minimal delay and switching times. The high-speed performance is achieved by means of a proprietary "Turbo-Driver" circuit that speeds up input stages by tapping the wider voltage swing at the output. Improved speed and drive capability are enhanced by matched rise and fall delay times. These matched delays maintain the integrity of input-to-output pulse-widths to reduce timing errors and clock skew problems. This improved performance is accompanied by a 10 fold reduction in supply currents over bipolar drivers, yet without the delay time problems commonly associated with CMOS devices. Dynamic switching losses are minimized with non-overlapped drive techniques.
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Space Power Solutions
Teledyne e2v HiRel Electronics (HiRel) offers leading edge power solutions dedicated for high-reliability applications. The introduction of Galium Nitride (GaN) technology solutions enable high power density designs with four times less space requirements than traditional MOSFETs. The Teledyne HiRel Point-of-Load (POL) products combine multiple load capabilities, outstanding radiation performance with high levels of integration and easy to use features.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Medium & High Voltage Pulse Generators (Rise Time > 1 ns)
Offer fast medium voltage pulsing with high current capability. These models are ideal for driving solenoids, pulse testing of MOSFETs, and other applications.
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Built-in MOSFET Integrated SiP
Renesas Electronics offers SiP products with integrated MOSFETs to enable easy configuration of high-performance multi-phase power supplies. They combine in a single package either controller, driver, and MOSFETs or driver and MOSFETs. These products make it easy to build a high-performance DC/DC converter while reducing stray capacitance and inductance, and achieving higher mounting density.
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General-Purpose Power MOSFETs
*Support for high-efficiency drive and low heat design*MOSFETs suitable for switching (motor drive, etc.) and load switch applications*Low on-resistance, high-speed switching, and high-robustness
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Unclamped Inductive Load Tester
ITC55100STD
Model ITC55100STD performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.
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MOSFET Drivers
Renesas' product portfolio includes MOSFET gate drivers for 3-phase motor applications. The drivers have built-in detection/protection functions and are suitable for inverter driver applications such as EGR, HVAC and EPS. Line up the products with LDOs for MCU, 24V battery system capability, built-in current sense amplifiers, and motor angle detection function. The products support unit downsizing and high performance.
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MOSFETs For Amplifier
These are enhanced power MOSFETs with excellent frequency characteristics. They are ideal for audio amplifier output.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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PCIe and VPX Compatible Adapter Carrier
PCIe2VPX3UX4
The power supply designs utilize switching regulators controlling MOSFET´s. An LC filter insures clean power at the VPX device. The PCIe gold fingers are rated for 1.1A each, and a total of 5.5A on the +12V rail. 55W are available to the card after power conversion.
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Gate Drivers
A necessary companion for discrete power MOSFETs and IGBTs as well as digital – microcontrollers, DSPs and FPGs – or analog controllers in any switched-mode power converter, STDRIVE gate drivers generate the necessary voltage and current level required to accurately and efficiently activate the power stage in industrial, consumer, computer and automotive applications.
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Device Thermal Test Systems
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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Brushless DC Drivers (BLDC)
Covering a wide range of power systems, our integrated MOSFET and gate driver ICs thrive in automotive, industrial, and consumer applications, ranging from 3.5 to 100 V operating voltage.
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Active Switching Rectifiers, 2 KW, P/N 6016C
- Active Switching Rectifier, 2 KW, P/N 6016C- Input Range: 9 VAC to 35 VAC, 3 PH- Frequency Range: DC to 10 kHz- DC output: 13.5 VDC, 70 Amps without any heatsink (Test #1)- DC output: 13.5 VDC, 150 Amps with heatsink (Test #2)- Dimensions: 8″W x 8″L x 3″H or similar- AC to DC and DC to DC applications- Generates less heat as power MOSFET Switching is used- The output voltage is the same as the input voltage
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Relay Switch For Medium- To High-Power DC Loads
S20DC100
Series S20 relays switch medium- to high-power DC loads. These devices feature the latest-generation MOSFET technology as well as an innovative isolated driver to ensure fast power turn on and off. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.
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1584W to 2500W - Single Output
HFE Series
*1U rackmount containing up to 5 units*Up to 29.2W/in³ power density*Internal ORing MOSFET & Current Share*High Efficiency*Up to 9,500W in 1U rack*PMBus™(I2C) and LAN options
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ORing FET Control
Renesas' ORing MOSFET Controllers with a suitably sized N-Channel power MOSFET(s) increase power distribution efficiency and availability when replacing a power ORing diode in high-current applications. They provide gate drive voltage for the MOSFET(s) with a fully integrated charge pump.
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Inductive Load Tester
4602-LV
There is a tendency that MOSFET has Low On Resistance so that it demands that Inductive Load Tester to have higher forcing current for measurement. The forcing current is limited by forcing voltage with previous test method. Thus it becomes difficult to test this kind of middle power range devices.
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Discrete & Power Modules
A product portfolio that offers full spectrum of high, medium and low voltage power discrete devices along with advanced power module solutions, including IGBT, MOSFET, SiC, Si/SiC Hybrid, Diode, SiC Diode, and Intelligent Power Modules (IPMs).
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Integrated Board Power Management Functions For The Forward Thinking Engineer
Power Manager II
*Up to 12 differential voltage sensors with immunity to noise on ground plane*Voltage trimming to within 1%*Ruggedized CPLD with up to 48 macrocells for sequencing and supervisory signal logic*Large operating power supply range (3.3 V + 20% to 3.3 V -15%)*Up to 4 High-Voltage MOSFET Driver Outputs*Voltage Measurement with 10-bit ADC through I2C*Up to 8 On-chip DACs for Margining and Trimming
