Image Analysis
The extraction and analysis of data from images.
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Product
Incident-based Abnormal Software Behavior Analysis Services
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If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
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Product
DCA-M High-Accuracy, Low-Cost Solution for Optical Waveform Analysis
N1090A
Oscilloscope
The N1090A DCA-M builds on that legacy by using the high-performance elements of 86100 and 86105C. It can be configured to perform thorough optical transmitter compliance tests at a variety of standard data rates from 1.244 to 11.3 Gb/s and come with 20 GHz electrical channel in option.
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Product
Data Analysis Software
APP ClearView
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APP ClearView™ is the ideal data analysis software for engineeres and managers that need system information and answers quickly. It has a wide varity of graphics, math functions, reports, and file manipultion features that allow the user to easily navigate through their data. It supportsimporting of indisustry standrad formats such as COMTRADE (Common Data Transient Data Exchange) version 1996, 1997, and 1999.
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Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Product
Raman Spectroscopy Analysis Laboratory
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Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Submicron Particle Imaging
FlowCam Nano
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Yokogawa Fluid Imaging Technologies, Inc.
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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Product
Calibrate Camera RAW Image Files
SpyderCUBE™
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Accelerate RAW processing by taking one reference shot under any light condition to set the white balance, exposure, black level and brightness right from the start for your entire series of photos.
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Product
Hyperspectral Imaging Camera
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Imec’s on-chip technology makes hyperspectral imaging real-time, compact and scalable. Leverage our knowhow to design a customized sensor or camera.
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Product
Acoustic Analysis
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Includes cursor readout of dB bands, max & min lines, noise curve overlays, pink noise generator, and optional STC Transmission Loss.
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Product
Advanced Data Collection, Display and Analysis Software for WIndows & Mac
PASCO Capstone
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PASCO is pushing the limits of technology, so you can push your students to their potential. Working closely with educators, we continuously develop Capstone™, making improvements and enhancing the teaching features. Capstone is designed to handle large data sets, high-speed sampling, and customized preferences to fit the needs of your lab. A straightforward user interface is approachable for beginners, yet Capstone offers all the capabilities needed for even the most advanced users. Our generous site license allows students to install PASCO Capstone on their own computers so they may perform data analysis off campus.
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Product
Sensing Analysis Software
ENLIGHT
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A single suite of tools for data acquisition, computation, and analysis of optical sensor networks based on the HYPERION system.
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Product
1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
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This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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Product
Cross-Section Analysis Laboratory
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PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
Real-time 1/1, 1/3 Octave Analysis Software
DS-0323
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This software analyzes the 1/1 and 1/3 octave bands for 2 - 32 channels (2 - 64 channels when two units are connected ) in real-time from 0.5 to 20 kHz. The filter is compatible with the IEC, JIS, and ANSI standards. The equivalent continuous A-weighted sound pressure level (Laeq) and the single-shot sound exposure level (Lae) are calculated simultaneously by setting measurement time. Variations in level (time series) for each band can be saved for up to 2,000 points.
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Product
PLTS N-Port Measurement And Analysis
N19307B
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PLTS N19307B extends the N19301B base product to perform N-port (greater than 4 ports) measurements and analysis
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Product
Infrared Thermal Imaging
JOHO640CM_A00
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Wuhan JOHO Technology Co., Ltd
OHO640CM_A00 is a high resolution 640x480 uncooled long-wave thermal imaging core. It is especially designed for OEMs. With lightweight and compact design, low power consumption and standard interface, it is very easy to be integrated into end-user products, such as portable surveillance thermal camera, UAV, thermal sight etc.
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Product
3D CMOS Image Sensors
Flash
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High-resolution in a rectangular format, specifically designed for 3D laser triangulation - Very high frame rate and throughput combined with high power efficiency, delivering outstanding sampling resolution and speed with a high Gbps/W ratio - HDR feature embedded on-chip, to measure all kinds of surfaces - Feature-rich sensors, to perfectly meet application challenges.
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Product
Cutting-edge 3D GPR array solution for efficient subsurface imaging cart solutions
Raptor
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The Raptor system covers a wide range of applications and can be configurated with 450 MHz or 800 MHz antennas. Raptor 3D Arrays are based on Real-Time sampling (RTS) technology and the unique antenna design is a milestone in the evolution of the GPR. A Raptor Antenna can be arranged in different ways, which allows for both standard and more advanced GPR measurements. These include common mid-point (CMP), wide-angle reflection and refraction (WARR) and Tomography.
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Product
Full-Wave Three-Dimensional Analysis Software
EZ-FDTD
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Based on the Finite-Difference Time-Domain method, EZ-FDTD brings the full power of electromagnetics to solve complex EMI/EMC real-world problems for any frequency ranges that your application demands. Eliminate guessing for critical problems. Eliminates rule of thumb uncertainty. Provides insight, confidence and solutions.
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Product
Surface Plasmon Resonance Analysis
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Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Product
Full 3D Inline Metrological & Imaging AOI
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Metrological Full 3D AOI is achieved by measuring all 3 dimensions (X, Y and Height) to detect every measurable solder and component defect pre-reflow and/or post reflow soldering.
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Product
PathWave BenchVue Advanced Power Control And Analysis For Multiple Instrument Connections
BV9200B
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Control and analyze voltage and current measurements from multiple N6705C, N7900 or RP7900 Series
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Automated Analysis Software
RevospECT Pro
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RevospECT Pro is the industry’s first commercially available high-powered, adaptable and scalable automated analysis system. It provides end users the power and control to perform comprehensive automated analysis of eddy current data. RevospECT has a proven track record in the field and meets rigorous industry standards for flaw analysis from bobbin, rotating and array inspection techniques. Once configured for an inspection, RevospECT Pro will process and analyze data at an extremely fast rate utilizing its robust distributed processing power, often outpacing data acquisition rates and generating results that can be verified immediately by the reviewing data analyst. More importantly than system speed is the consistency of the results that are delivered using computer-aided analysis.
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Product
2D CMOS Image Sensors
Emerald 36M
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Superior 36 Megapixel resolution - 6K square resolution - Multi-ROI feature enabling more objects to be captured in a single high resolution shot - Small global shutter pixel for blur-free images.With its high resolution, Emerald 36M improves inspection accuracy, increases throughput through an optimized inspection system path, and covers wider areas for surveillance or aerial mapping.
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Product
Zero-footprint Coverage Analysis For Critical Software
RapiCoverZero
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*Collect coverage from systems that produce branch traces*Save time with efficient merge and mark verification workflow*Simplify verification through integration with your CI tool*Collect coverage for libraries without source code
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Product
Advanced NDT Data Acquisition & Analysis
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WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld inspections.
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Product
Impedance Analysis
S96041B
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Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
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Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Product
Thermal Imaging Solutions
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Fluke Process Instruments’ thermal imaging solutions provide 24/7 monitoring capabilities to keep your process, products and site under control. Our fixed thermal imaging cameras feature IP67 (NEMA 4) rated housing and are designed for the most demanding and harsh conditions.
