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JTAG Emulators
Exercise a processor's (DUT) on-chip debug services to perform JTAG emulation and debug.
See Also: JTAG, JTAG Controllers, JTAG Debuggers, iJTAG, P1687
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Advanced JTAG Emulators
Blackhawk offers JTAG Emulators ranging from entry level to full-capability debug probe models supporting System Trace (STM), starting at $99. This includes XDS100v2, XDS200 and XDS560v2-class models that are compatible with Code Composer Studio.
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JTAG Emulators
XDS100v2 Series
The XDS100-class JTAG Emulator is an ultra-low-cost entry level JTAG debugger for TI devices. Blackhawk offers two models, each with two JTAG target connections. One model includes TI JTAG connections for 14-pin TI and 20-pin cTI JTAG headers. The other model provides ARM 10-pin and 20-pin JTAG connections. Both models are identical in software and device support except for the the target connections, so pick the one that matches your target board connection.
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High-Performance JTAG Emulators
XDS560 Series
Blackhawk XDS560-class models are offered with PCI, USB, and Ethernet host interfaces. These XDS560 models support the first generation of TI XDS560-class high-speed JTAG connection between Code Composer Studio and the target device.
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Emulators
High fidelity DC power system and motor drive inverter testing is made achievable with the use of advanced power emulation.
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JTAG Visualizer
JTAG Visualizer is an advanced graphical viewer and data management system for PCB schematics and layouts. Visualizer integrates seamlessly with the JTAG Technologies family of boundary-scan products, such as the ProVision application development platform, and accepts PCB data from a variety of CAD, CAM and EDA tools. In design Visualizer provides DfT (design for test) feedback to the user by enabling a graphical view of fault coverage on their design. In manufacture and test Visualizer can be used to highlight faulty nets (short circuits, opens, stuck-ats etc.) in both layout and schematics views.
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Wireless Network Emulators
Keysight’s industry-leading range of wireless network emulators and device test solutions enable the entire mobile device ecosystem to accelerate the market introduction of new wireless devices by streamlining the workflow from early prototyping, development, and design verification to conformance, carrier acceptance, and high-volume manufacturing.
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JTAG Boundary Scan
Our partnership with JTAG Technologies enables us to provide you with a comprehensive JTAG Boundary Scan Test Development Service.
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Other Emulators And Options
The External Flash Definition Editor is utility software for programming user data to an external flash memory. The user-friendly GUI-based functions make it easy for the user to set parameters and create a definition file for programming an external flash memory. By simply registering the definition file in the emulator software and executing the download function, the user can write data through the emulator to the external flash memory embedded in the user system.
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Emulators
Processor emulators are tools that allow you to work in real time with various types of chips. We offer tools for Texas Instruments signal processors and families such as: 8051 AVR, ARM etc.
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System Trace Emulators
XDS560v2
The XDS560v2 System Trace Emulator is the second generation of the XDS560-class emulator design from Texas Instruments. It provides cost effective real-time emulation, debugging, and high-performance System Trace (STM) for Texas Instruments devices over both USB and Ethernet PC interfaces.
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JTAG Emulator
Blackhawk USB510L
The Blackhawk USB510L JTAG emulator is low cost, and has a USB powered interface.
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Mixed Signal JTAG Tester
JT 5705
The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.
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JTAG Protocol Exerciser and Analyzer
PGY-JTAG-EX-PD
Prodigy Technovations Pvt. Ltd.
JTAG Protocol Analyzer (PGY-JTAG-EX-PD) are the Protocol Analyzers with multiple features to capture and debug communication between host and design under test. PGY-JTAG-EX-PD is the leading instrument that enables the design and test engineers to test the respective JTAG designs for its specifications by configuring the PGY-JTAG-EX-PD as Master/Slave, generating JTAG traffic and decoding the JTAG protocol decode packets.
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JTAG Emulator
Blackhawk XDS560v2
The Blackhawk XDS560v2 STM emulator has System Trace capability, along with USB powered and LAN interfaces.
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Advanced Network Emulators
Netropy
Netropy advanced network emulators simulate up to 15 separate WAN links, each with their own bandwidth, delay, and loss characteristics, through each pair of physical ports. Packets can be assigned to individual links by IP address range, VLAN, or any other packet specifier.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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JTAG Boundary-Scan I/O Modules
SCANIO Family
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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DataBlaster PCI / PCIE JTAG Boundary-Scan Controller
JT 37x7/PCI
High speed and performance JTAG Boundary-scan PCI PC plug-in controller for PCI bus slot or PCIe PC plug-in controller for PCI Express bus slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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JTAG Isolation Protection
Our line of JTAG isolators help protect your investment in computers, development boards, debug probes, and lab equipment. Each model connects easily between your target board and debug probe.
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Transient Suppression for Corelis JTAG Controllers
TAP Protection Adapter
Transient events such as Electrostatic Discharge (ESD), inductive switching, and lightning can damage electrical equipment, leading to costly repairs and test equipment down-time, reducing production capacity and increasing time-to-market.The Corelis TAP Protection Adapter is designed to enhance protection to any Corelis JTAG controller, shielding against harmful events using a combination of electrical defenses.The compact adapter features series resistors and transient voltage suppressor (TVS) diodes to mitigate damage to the JTAG controller. Protect your investment and enjoy peace-of-mind with the TAP Protection Adapter.
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High-Performance LAN & USB JTAG Controller
NetUSB II™
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
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JTAG Emulator
Spectum Digital XDS560v2-STM
The Spectrum Digital XDS560v2-STM emulator has System Trace capability, along with a USB powered interface.
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JTAG Emulator
Spectum Digital XDS510-USBPlus
The Spectrum Digital XDS510-USBPlus enhanced JTAG emulator is low cost, along with a USB powered interface.
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TAP Adapter for Corelis JTAG Controllers
Low Voltage Adapter
High technology, energy efficient, and small form factor products push JTAG interfaces to the limits; low power and high performance means low voltage, high speed, and high drive requirements. Building specialized interface circuits on product Printed Circuit Boards (PCBs) is inconvenient and costly—an out-of-the-box, external solution is needed.The Corelis Low Voltage adapter is an add-on accessory that provides existing scan controllers with an active, plug-in interface to access low voltage scan chains, without sacrificing performance.
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Single-TAP CFM JTAG Controller for Teradyne ICTs
USB-1149.1/CFM
The USB-1149.1/CFM High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.
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JTAG 3rd Party Controller Support
Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
