EMC Test
assures noise immunity or electromagnetic amicability.
See Also: EMC, EMC Analyzers, EMC Probes, EMC Software, EMC Testing Services, Reverberation Chambers
-
Product
NI Automated Test Software Suite
-
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
-
Product
Test Port Cable, 1 Mm
11500I
-
Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
-
Product
Modular Functional Testing Platform
OTP2
-
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
-
-
Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
-
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
-
Product
EMC Subracks
101.1/10/11
-
VECTOR Electronics and Technology, Inc.
VectorPak™ EMC Rugged subracks for heavy duty applications where a high resistance to shock and vibration is required. Its features include heavy two-screw fixing extrusions, 2.5mm thick side panels / rack flanges and conductive finish throughout.
-
Product
Automated Test Systems
-
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
-
Product
EMC Scanner
EMxpert
-
EMXpert is a unique magnetic near field scanning system that helps designers be highly productive in understanding and diagnosing these problems, quickly and early in the development cycle.
-
Product
EMC Analyzers
-
Mains and harmonics analyzer and associated low distortion AC power source for EMC measurements to EN61000-3-2 and EN61000-3-3.
-
Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
-
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
-
Product
PXI Semiconductor/IC Test System
-
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
-
Product
Digital Test Instruments
-
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
-
Product
SoC Test System
V93000 SoC / Smart Scale
-
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
-
Product
Compact Case 20 EMC XS |Comfort | 150 mm
20E-101-150
-
The Compact Case 20 combines flexibility, practicability and intelligent design. Available in four different sizes and three different finishing options. Optionally also with EMC protection.
-
Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
-
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
-
Product
High Voltage EMC Surge Generator
TM510
-
TM510 Surge Generator is mainly used for testing power cable high-resistance and arc-over fault whose grade range is 0-10kV, co-operating with cable fault tester and locating devices to test and locate faults. If the user choose the professional digital milli-ampere-meter, as for cable with grade range about 0- 6kV, the instrument can also be used to do DC&voltage resistance test and current leakage test after the fault is repaired. The instrument is internally equipped with voltage-rise rectifying and discharging device, has complete functions, and is also convenient and safe to be wired and operated.
-
Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
-
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
-
Product
RSE Wireless EMC Spurious Emission
TS8996
-
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
-
-
Product
BSD (Test Diagnostics)
-
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
-
Product
Photonics Wafer Probing Test System
58635
-
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
-
Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
-
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
-
Product
In-Circuit Testing and Test Engineering
Teradyne Z1890
-
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
-
Product
Wireless Device Test
-
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
-
Product
EMC Actuators
-
often referred to as an Electromechanical Cylinder (EMC)—is a device that converts electrical energy into precise, controllable linear motion.
-
Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
-
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
-
Product
EMC Chambers
-
A specialized, shielded room designed to test electronic devices for radiated and conducted electromagnetic interference (EMI).
-
Product
PCIe 4.0 Test Platform
PXP-400A
-
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
-
Product
Semiconductor Test Software
-
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
