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System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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System Test Fixture
Chassis Level Test Fixture, Set Box Test Fixture, and more by IST Engineering
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Switching System Test Tools
EBIRST™
Switching systems are an important part of many test systems, however, the switching system is in a vulnerable place. When accidents happen that can cause a faulty device, you need a way to get the system up and running again with a minimum of effort and operator skills.
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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HSI System Test Panel
TA-500
This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Shock Test System, Battery Test
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's shock test system used to measure and determine the impact resistance of a product or package. It is mainly used to evaluate the reliability of the function and the integrity of the structure of the test product under impact environment. Suitable for impact testing of aerospace, aerospace, marine, military, consumer electronics, automotive, household appliances and display equipment.
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Weapon Control System Test Set
MS 1102
- Provides serviceability checks on armament system- Portable instrument- Check the Bomb release sequence, practice bomb release sequence, rocket release sequence, fuzing, and jettison of aircraft stores- Helps to identify faults of conventional armament- Microprocessor based design
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Battery Management Systems Testing
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Battery Testing Chambers
We supply a variety of test chambers for testing small battery cells to large lithium ion battery packs. Battery test chambers are supplied to a variety of industries including telecommunications, computer and automotive. With the goal of reducing automobile emissions and the development of electric vehicles, the need for lithium ion battery testing is even more critical. Our proven experience provides the most cost-effective solutions. Each test chamber is built according to specific test requirements and may be interfaced with battery cyclers, control & monitoring data acquisitions systems and other test equipment for a complete integrated test solution. All environmental chambers are designed with safety in mind. A variety of safety features are provided for reliability and abuse testing of batteries. These features may be incorporated into CSZ test chambers and tailored to the various hazard levels of EUCAR (European Council for Automotive R&D), a consortium of European car manufacturers. To better assess the hazard potential of tests, EUCAR has investigated hazardous situations and divided them into eight risk classes. The development of the safety equipment of our battery test systems is also based on this classification. For each hazard level, we recommend specific safety options that can be included with your chamber to meet your specifications to safety test your product. Together with our customers, we assess which safety devices are necessary for the respective test chambers.
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Imaging Gauge Software Test System
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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Mixed signal LSI test system
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Partial Discharge Measurement System
DAC-6021
DAC-6021 is a measurement system for testing Partial Discharge of high frequency equipment, power devices, stator coils, etc.Since the system combines Partial Discharge Measuring Instrument (DAC-PD-3) with Testing Corona-free Variable Frequency Voltage Source (DAC-WT-50) and Testing Shielded Chamber, most external noises are removed, and the measurement is safe.
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Structural Durability Solutions
Instron offers a variety of testing systems and rigs for static, quasi-static and dynamic loading of structures and components. This includes Component Test Systems, Shaking Tables, Road Simulators, Axle Test Systems, Full Vehicle Test Systems, Wheel Test Systems, Shock Absorber Test Systems, Elastomer Test System and Dynamic Torsion Test Systems.
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MU Cable Tester System
16814
The MU Locomotive Trainline/Cable Test System (MU Test System) can perform shorts testing, continuity testing, and ground-leakage testing on each of the 27 pin Multi-Unit Trainlines normally found on Freight Locomotives. The MU Test System is comprised of two identical tester units. Each unit is installed in a rugged, water resistant Pelican case. Each unit contains an MU cable receptacle that mates with a 27 pin MU jumper cable. A snap-on vinyl pouch on the outside cover of each unit provides storage for the battery charger/power adapter and the chassis test lead. The enclosure cover hinges separate from the test unit as the cover is opened; this removes the cover completely to allow free access to the MU cable receptacle and the control panel.
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Air Data Calibrator
ADC-2555
TestVonics ADC-2555 Air Data Calibrator is a high accuracy pitot static calibrator. The ADC-2555 is capable of controlling and measuring Altitude and Airspeed pressures with the highest degree of accuracy. The control and measurement range of the test system can meets or exceed requirements for both commercial and military applications. The ADC-2555 is a derivative of the ADC-2500 Series. It features a touchscreen interface, a mid range 23PSIA sensor and features TestVonics automated calibration software for the TTu-205J Pressure-Temperature Test Set.
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Steering Module Test Systems
Steering test systems for quiet evaluation of rattle, NVH & performance issues – non-hydraulic. The MB Dynamics Steering Module Test Simulator family of technologies (SMTS) is an assembly of components and software designed to facilitate the quiet testing, development, troubleshooting, and auditing of a variety of steering gear and steering column assemblies — collectively referred to here as steering modules (including components).
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PXIe-6544, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument
780992-02
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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OPTICAL PHASE NOISE TEST AND MEASUREMENT SYSTEM
OEwaves’ HI-Q® Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Flight Line Avionics Test
The TS 717 Test Set for ARINC 717 is a convenient, easy-to-use tool for test and maintenance of aircraft systems that are tied to the Digital Flight Data Recorder (DFDR). The compact interface/cable hardware is conveniently stored in a rugged carrying case for easy transport and quick deployment.The webFLT™ is a wireless functional tester for aircraft systems using the Digital Flight Data Recorder ARINC 717 bus. It connects directly to the aircraft system test plug and transfers data to the test computer via an 802.11 b/g wireless link, eliminating cabling in the crowded cockpit that can be tripped over or damaged.
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Optical Test Instruments
OptiSpheric® & Spherometer
TRIOPTICS' OptiSpheric® and Spherometer are the classic optical test systems for spherical lenses that can be found in virtually any optical manufacturing process. While the Spherometer is used for the tactile determination of lens radii, OptiSpheric® systems provide contactless measurement of effective focal length, back focal length, flange focal length, MTF on axis and the radius of lenses. Specific upgrades allow determining centration errors and angles on plane surfaces. Systems for testing IOLs in compliance with EN/ISO 11979 form a class of their own. OptiSpheric® IOL R&D is preferably used for measuring single lenses while OptiSpheric® IOL PRO 2 is designed for the fully automated IOL measurement in serial production.
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JTAG Test Procedures
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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EMC Test Systems
The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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Fully Automated In-line Test System For LED Light Engines
We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
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Embedded System Test Automation Software
ECU-TEST
ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
