Component Test
A combination of two or more interrelated equipment (sets) arranged in a functional package to perform testing of particular components. (atis.org)
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Transmission & Hydraulic Test Stands
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Our equipment tests automatic and automated-manual transmissions. On and off-highway transmission test stands, transmission and hydraulic component test stands and valve body test stands. AIDCO Test Systems offers the latest in modern, electric motor and hydrostatically-driven transmission test stands. All units may include an air-cooled eddy current absorber (standard on the 450E), resulting in minimal dyno test cell noise and reduced maintenance.
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Sensors, Probes And Coils For Component Testing
Sensors
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Foerster Instruments, Incorporated
We offer a comprehensive range of standard and customised sensors, probes and coils for component testing. If the wide selection of standard sensors does not optimally solve your testing task, we offer you an individual new development specially adapted to your testing task. Thanks to our many years of experience, you receive reliable sensor technology for reproducible test results.
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Countermeasures Sequential Timing & Amplitude Tester
C-STAT
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C-STAT, or Countermeasures Sequential Timing and Amplitude Tester, is a Firing Pulse Interval Test Set, a suite of test components designed to analyze firing pulse timing and amplitudes from a CMDS system such as ALE-47.
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Laser Test Systems
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Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers.
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LCR Meters
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An LCR meter measures impedance (inductance, capacitance and resistance) at spot frequencies.It is used for testing components and materials in R&D applications and in componet manufacturing.
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Product
6-24V Multi-functional Auto Tester With LED Display
6510A
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Peaceful Thriving Enterprise Co Ltd
Test the automotive electrical system within 6-24V. In order to save the testing hours for the automotive electrical system, the tester is designed to test the system without re-connection between the vehicle battery and the testing components. For the testing and safety purpose, the tester contains short-circuit protection, which can also check the ground connection without voltage drop test. The short-circuit protection system contains the recoverable fuse, so the technician will not waste the fuses during the testing. The extension cable is long enough for a technician to test the whole system for the vehicle. Therefore, the technicians do not have to search for ground connection constantly.
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C and C++ Testing, Static Analysis, Code Review
C++test
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Parasoft C++test is a complete C/C++ developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes. Available for common enterprise and embedded environments.
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Test Bench Automation & Control Software
itk.TACware
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Automation software for the effective, time efficient and user friendly operation of component test benches. The structure and implementation of the software is specifi cally optimized for highly dynamic test benches with high demands on control quality. Inparticular, itk.TACware provides a solution for test benches of medium degree of complexity (e.g. steering test benches and suspension strut test benches), that meets all current requirements for test bench automation.
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Fatigue Rated Low Profile Cells
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Fatigue rated load cells are specifically designed for component durability and fatigue test machines where highly cyclical loading is present. These rugged load cells are extremely resistant to extraneous bending and side loading forces. They are used for material testing, component life cycle testing and structural testing. All fatigue rated load cells are guaranteed against fatigue failure for 100 million fully reversed cycles.
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Rebuilt Testers
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Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Precision Cable Test
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Innovative cabling and component test solutions designed for Laboratory, Manufacturing, and Field Use applications.
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Custom Testing
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You create a custom test plan (a file that lists a series of tests to be run), to meet requirements specific to your environment and apply that test plan to any number of clusters. You specify the order in which tests run and the specific components to be tested. After you set up your custom test environment, you run the test procedure from SMIT and view test results in SMIT and in the Cluster Test Tool log file. For information about customized testing, see Setting up custom cluster testing.*Fixture Design*Fixture Fabrication*Custom Test Stands*Prototype Testing Services*Product Safety Testing Services
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MTM-IO-Serial: Software Controlled USB Hub and IO Module
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As part of Acroname's MTM series, the MTM-IO-Serial module is a key component to manufacturing test systems for electronic devices using a standard USB 2.0 interface, serial UARTs and one or more interface voltages. The MTM-IO-Serial module features a software controlled USB hub (USB 2.0 high-speed) with four controllable channels. Each channel has switched data and 500mA current-limited power lines.
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FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
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Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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TestBench & Planar Biaxial Test Instruments
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TestBench configurations were designed with component testing in mind, and thanks to their modular approach, a wide array of configurations and performance capabilities are possible. TestBench systems can be multi-channel and multi-axis, including planar biaxial testing.
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IPX5 IPX6 Water Spray Test Device
CX-IPX56B
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Shenzhen Chuangxin Instruments Co., Ltd.
Drop rain rain chamber Uses: This equipment is main to test the physical and other related properties of the products in the environment of simulated rain, such as electronic and electrical products, lamps, electrical cabinets, electrical components, automobiles, motorcycles and their parts and components. After the test, through the test result to determine
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Millimeter-Wave Noise Source, R-band, 26.5 to 40 GHz
R347B
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The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.
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Product
High Power, Low PIM Switch Unit
LPSU
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Low PIM coaxial switch matrix 5 x 6 or 1 x 4 configurationFrequency range 698-2700 MHz.SCPI commands via Ethernet (wired or wireless).Significantly reduces test time for multi frequency PIM applications.Applications: ATE systems, multi-band antenna and component testing.
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Product
Single Fiber Aligner
1100
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The 1100 Single Fiber Aligner uses patented fiber alignment concepts to produce virtually instantaneous temporary couplings for OTDR, dispersion, or any other optical fiber or component test that requires a fiber-to-fiber connection. It delivers low loss, low reflectance couplings on the first try virtually every time, without the need for test instrument feedback. As a result, temporary coupling times are minimized and manufacturing costs are reduced without compromising product quality.
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14-bit 16 Concurrent Channel 65MSPS A/D board
AD14-65Mx16AVE
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14-bit 16-concurrent channel 65MSPS A/D board for demanding large-system uses, where signals on multiple time-aligned channels need to be observed with high SNR, such as RADAR, nuclear instrumentation, ultrasound, medical imaging, spectroscopy, communications systems, RF component and antenna testing and other critical applications. An on-board low-jitter LMX2581-based RF synthesizer allows any A/D sampling rate between 20MSPS and 65MSPS to be specified in software. A second on-board LMX2581 with synchronized reference can be optionally used to output four stimulus clocks on SMA connectors that can be vectored to any combination of 4 external transmitters, microwave pulse generators, laser modulators, and other devices.
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Component Testers
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After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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EMC Testing Services
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Our sophisticated technology can meet the diversified needs of customers. Component Tests: Immunity, Radiated Immunity, ALSE, TEM cell, Bulk Current Injection, Stripline, Conducted Immunity, Transient Immunity, Power Supply Variations, Electrostatic Discharge Emissions, Radiated Emissions, Conducted Emissions, Transient Emissions. Vehicle Tests - Radiated Immunity, Radiated Emissions.
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Sand and Dust Environmental Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Sand and dust test chamber is suitable for all kinds of automotive parts dust-proof, dust resistance test. Test components including automotive lights, instrumentation, electrical cover, switch system, door lock, etc., and test its sealing performance. Besides, it also has view window with illumination.
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Product
PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
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The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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AC source/sink
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The static AC source contains tried and tested components from our UPS technology., Available with adjustable output frequency and/or output voltage., Clear design, tried and tested components and easy maintenance characterize this AC source.
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Product
Insertion Loss Test Set
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OptiConcepts FiberWarrior Pro™ Insertion Loss Test Set is used for the following functions: continuity check, fiber loss, return loss, and connector loss for OEM, lab, and production use as well as transport, metro, access, and FTTx/PON networks. The FiberWarrior Insertion Loss Test Set performs single-mode and multimode loss measurement functions, including single component and multi-fiber testing.
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Test Solutions For MROs
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Through our 50+ years of experience, we’ve designed equipment that test components on nearly all aircraft platforms. Because of our experience and our attention to industry trends, we can anticipate what components you’ll be testing tomorrow. We design our test stands to exceed your current test requirements for simple upgradability to ensure that you’re ready for the future.
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PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
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The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Thermal Platforms
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Thermal Platforms are perfect for using conductive transfer to test components hot and cold, they work best for parts with a low or flat physical profile. They transfer heat outstandingly for programmed or very rapid heating and cooling transition times (that’s why they’re called hot plates or cold plates as well), and have a precise temperature control every time from cryogenic temperatures to extremely hot
