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Test Point Terminals
Zierick Manufacturing Corporation
Zierick PCB test point terminals offer exceptional designed-in flexibility, allowing test engineers to easily attach J hooks, EZ hooks, lead grabbers, clips and other test probes.All Zierick test point terminals are available with stress-free Accu-Lok mounting for a reliable PCB interconnection.
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PC Controlled Low Voltage Tester
Cablescan S9
The Cablescan S9, with a 9-board Expansion Cabinet, may be ordered with 1 to 9 low-voltage 128-point scanner boards. Fully loaded with scanner boards, this tester provides 1152 test points.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Megohm Meter
Digital Megohm Meter, model SMG5, is a compact standalone meter designed for checking HVAC compressor insulation. The SMG5 provides a 1000V voltage source, monitors current, and displays the resistance between the test points. Maximum current output is <1mA. It can be used to determine the condition of insulation from winding to ground in a motor, compressor, or transformer. Includes a case, alligator clip lead tip and leads with removable tips.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Passive Fiber Network TAPs
Passive network test access points (TAPs) are a hardware tool that allows you to monitor your network. Garland Technology offers fiber network TAPs in network speeds of 1Gb, 10Gb, 40Gb and 100Gb. Fiber Network TAPs are passive, purpose-built hardware devices that make a 100% copy of your networks data - without affecting network traffic. Passive network TAPs let your monitoring tools to see every bit, byte and packet®.
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Breakout Box
T1000-62HD
Our most expansive breakout box, using dual High Density 62 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 124 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity.
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SWB-2817, 16x22, 0.3 A, Reed Matrix Module for SwitchBlock
781421-17
16x22, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2817 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Test Board For QSFP+ Transceiver
EQSFP10
The OPTELLENT EQSFP10 is a cost-effective and convenient test board for testing QSFP/QSFP+ optical transceivers in R&D and manufacturing environments. The EQSFP10 is equipped with high quality RF connectors for data signals and test points for low frequency control and status signals. The EQSFP10 is equipped with power supplies to enable voltage margining. Key status signals are displayed using LED indicators.
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Testability analysis
Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
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Low Voltage Test System
CKT T1
The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Low Voltage Cable Tester
1100R+
The 1100R+ bench top cable tester packs impressive capabilities into a package that is small, affordable, and intuitive. The large display and sensible button interface make cable testing quick and easy. Test Point Range: 128-1024, Test Voltage: 5VDC 6mA max current.
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Configurable Reostat or Potentiometer Module
YAV90084A
4x 8-Bit 1KOhm reostat4x 8-Bit 40 Ohm reostat2x 8-Bit 5 MOhm reostat10x Electronic Potentiometer 8-bit resolution -256 steps- with build-in self test10x Voltage to current source 0(4)..20mA10x Analog Outputs (buffer for voltage or frequency)36-Ch Test Point voltage divider2xCAN Bus Channels Terminators testerExpandable with NI PXI-6723 and PXI-6345.
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Switches
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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15 Pin Breakout Interface
VSI-Breakout-15
The VSI-Breakout-15 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Wire Harness Tester
NX Solo
The Dynalab NX Solo Wire HarnessTester is a low-cost, feature-packed, stand-alone tester with a maximum capacity of 256 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to decide which operation to perform next. Testing for continuity, shorts, and a variety of components.
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Reference Thermapen®
Until now you would have spent hundreds more to get this level of accuracy in a NIST-Traceable standards thermometer. Our Reference Thermapen takes lab accuracy into the field. Each unit is factory calibrated at 5 test points and includes a UKAS accredited calibration certificate with test data. A true "system calibration" is performed matching its Platinum RTD sensor and the built-in electronics so all errors are included in the spec.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Matrix Modules for 34980A
The 34980A matrix modules are full cross-point matrices allowing you to connect any row to any column in the same instance. This is a convenient way to connect multiple test instrument points to multiple points on a device under test. All matrix modules also include a relay switch counter to help predict when relays need to be replaced.
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50 Pin Breakout Interface
VSI-Breakout-50
The VSI-Breakout-50 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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PXI Based Multifunction Measurement and ICT Instrument
PXI-501
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Programmable Hi-Pot Tester
DU331/332/333
Delta United Instrument Co., Ltd.
Large LCD Display Window for Setups and Test Values Output Frequency 50/60 HZ SelectableAll Initial Default Function Setting scan be Changed Easily to Fit RequirementEasy Manual Driven with Cursor Guiding Operation Mode Battery Backup Function will Recall theTest Parameter Settings before Power offLarge Memory (100 sets) for Setup Steps & ParametersEach Memory offers 9 steps of different Test ParametersTest mode: Single Step, Multiple Steps (Step by Step), Test Circle Number or Continuous Test are Programmable DU333 is designed for Multi-point Scan Test DU331/DU332 can perform Multi - point Test when used with Scan Box DU330
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Other Passive Probes
Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
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Very High Density Fiber Tap
Flex Tap VHD
Keysight Network Applications and Security
Flex Tap VHD is a modular, very high density fiber tap available, offering up to 36 taps in a 19 inch 1U space, to reduce IT costs while helping ensure availability of security and business critical applications. Network taps (test access points) are a key part of the access layer of a visibility architecture because they are an unobtrusive way to capture monitoring data. They offer comprehensive traffic visibility for network monitoring and security tools that do not introduce points of failure in the network. Ixia has a large variety of network taps on the market today, offering speeds from 1Gbps to 100Gbps, single and multi-mode, as well as different fiber types and support for Cisco bidirectional (BiDi) transceivers.
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Cable Phasing Meter
4183 CP
Standard Electric Works Co., Ltd
● Safely operates at low voltage ● Measures system voltage.● Measures capacitance of test point if system voltage is known.● Checks phase rotation of cables.● Phases out cables.● Rugged - comes with portable case.● Operates from potential test point of elbow connec-tors.● Battery operated.
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Test system for Electronic Device
PCB
The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Optically Isolated Measurement System
IsoVu
IsoVu offers complete galvanic isolation and is the industry’s first measurement solution capable of accurately resolving high bandwidth, low voltage differential signals in the presence of large common mode voltages. The stand out feature of IsoVu™ is its best in class common mode rejection across the entire bandwidth. Accurate differential measurements rely on a measurement system’s bandwidth, rise time, common mode voltage, common mode rejection capability, and the ability to connect to smaller test points to characterize devices that are shrinking in size and increasing in performance. Despite these requirements, advancements in test and measurement for power testing, EMI testing, ESD testing, and remote measurement capability have been minimal at best and have not kept pace with changing requirements. While differential voltage probes have had modest performance gains in regard to bandwidth, these probes have failed to make any substantial improvements in regard to common mode rejection, and connectivity. IsoVu is a leap forward in technology and is the only solution with the required combination of high bandwidth, high common mode voltage, and high common mode rejection to enable these differential measurements.
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Breakout Box
T1000-15
T1000-15 breakout box with dual 15 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 30 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity. Ideal for continuity measurements, isolation testing, and signal capture.
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Data Acquisition Switch System
M300
No matter the product performance test in the R & D stage or the automatic test in the production process, for the application of multiple test points and multiple signal measurement, the M300 series data acquisition / switch system with modular structure combines the precise measurement function with the flexible signal connection function, and can provide a wealth of test measurement solutions.
