Audio Test Systems
See Also: Audio Test, Audio Testers, Speaker, Acoustic
-
product
Audio Analyzer
MS20
The MiniSonic MS20 is a combined oscillator and measuring set in a stand-alone unit, which is both compact and portable. As well as being a quality tester the MS20 is a precision line-up tool, a stereo PPM, a balanced-unbalanced convertor (both ways), a stereo microphone pre-amp, a headphone amp, and a level convertor.
-
product
Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
-
product
Camera Test System
FS 8681 / SR
FS8681/SR is software for evaluating images* and making pass/fail judgments in camera mass production inspections. It consists of the "Editor FS8681" application that sets the inspection content and the "Sequence Runner FS8681SR" application that executes the set inspection.
-
product
Digital Serial Data Audio Interface
PIO-9216
For accurate testing of devices that use the I2S, Left Justified, Right Justified and TDM audio data formats.
-
product
Audio Matrix Switches
Audio Matrix Switches from novotronik are used whenever it is necessary to route balanced or unbalanced audio signals. A wide variety of features like gain control or impedance switching are available. In addition to our standardized devices, we also know to convince in the realization of your individual requirements.
-
product
Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
-
product
Six-Cell Diffusion Testing System
Phoenix DB-6
The Phoenix DB-6 (six-cell diffusion block) provides an ideal platform compliant with 21 CFR Part 11 for release-rate testing of six vertical diffusion cells at once using manual sampling methods. Controlled by an advanced computerized display, the DB-6 provides uniform and precise heating and stirring of six cells. The compact footprint of the DB-6 economizes on lab bench space.
-
product
Universal Testing Systems (Up to 600 kN)
5980 Series
Instron 5980 Series floor model testing systems are universal, static testing systems that perform tensile and compression testing; and also perform shear, flexure, peel, tear, cyclic, and bend tests. The 5900 Series are engineered for precision, built for durability, and offer the flexibility for changing requirements. They are designed with standard and optional features that increase testing efficiency and improve the testing experience for the operator. 5980 Series floor models are robust, heavy-duty frames commonly used for testing high-strength metals and alloys, advanced composites, aerospace and automotive structures, bolts, fasteners, and plate steels. Frames are available in load capacities of 400 and 600 kN.
-
product
Conformance Test Systems
With an established market leadership position in GCF and PTCRB approvals for LTE-Advanced and all leading-edge technologies, Anritsu continues expanding its number of test case validations in GCF and PTCRB for Protocol, RF and RRM conformance testing. With increasing complexity of wireless technologies, Anritsu Conformance Test systems provide easy-to-use control software to maximize testing efficiency.
-
product
COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
-
product
Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
-
product
Cable Sheath Testing and Fault Location System
Shirla
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR shirla. Shirla the fault location system is used for cable and cable sheath testing as well as for pre-location and pinpointing of cable faults. The pre-location based on the measuring bridge principle according to Murray and Glaser that is designed especially for power cables, also enables pre-location for control and lighting cables. Null balance and evaluation take place automatically.* Cable and cable sheath testing up to 10 kVC* Resistance measurement* Cable and cable sheath fault pre-location with precision measuring bridge* Adjustable cable sections that can be defined with length, conductor cross-section and material respectively and can be considered in the distance calculation
-
product
Cogging Test System
CTS
Magtrol’s Cogging Test System is a stand-alone test system designed to control and measure Detent Torque, Cogging Torque and Friction Torque. The test System includes a precision geared motor, a TS Series Torque Sensor integrating a 5 000 pulses encoder. CTS 100 to CTS 102 have a built-in security clutches to avoid system overload by mishandling when not in use. The geared motor drives the MUT (Motor Under Test) at a low speed from 1 to 10 rpm (respectively 8 rpm for CTS 103 and CTS 104), while acquiring its cogging torque related to angle position.
-
product
AC Hysteresis Graph Test System
DX-2012SA
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
-
product
SHARC Audio Processors/SoCs
Featuring the Analog Devices SHARC® and SHARC+® digital signal processing (DSP) core technologies, the SHARC audio processor portfolio offers deterministic and very low processing latency with best-in-class MIPS/mW performance. The SHARC processor family dominates the floating-point DSP market with exceptional core and memory performance and outstanding I/O throughput. With multiple product variants and price points, SHARC brings real-time floating-point processing performance to many applications where dynamic range is key.
-
product
Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
-
product
Portable System for High-Boltage Solid Dielectrics Testing
HVTS-70/50
Portable system HVTS-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
-
product
Test Tables / System Solutions
WEETECH, as a manufacturer of test equipment, offers its customers also a "Ready To Use" test system solution. It consists of the test table, the customer-specific adaptation as well as the test device, and is very quickly ready for use at the customer's site. According to the customer's requirements, the set-up is designed as a system with permanently installed adaptations for the production of constant cable harnesses in large quantities or with interchangeable adapters for the flexible production of different cable harnesses. Depending on the application, a larger table version or a smaller desk version is available. Various interfaces are available for integrating these solutions into a complete production automation system.
-
product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
-
product
Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
-
product
VLF Test System
BAUR PHG 70 portable
BAUR Prüf- und Messtechnik GmbH
Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
-
product
Intraocular Lens Optical Test System
OptiSpheric® IOL R&D
The OptiSpheric® IOL R&D is specially designed for the analysis of single intraocular lenses in research and development. With the OptiSpheric® IOL R&D, important parameters of all types of lenses (monofocal, multifocal, trifocal, toric, aspheric and those with extended depth of focus (EDOF) – whether diffractive, refractive or sectors) can be measured and tested in air or in situ in accordance with ISO 11979.
-
product
Simulation & Analysis Solution for Automotive Audio Networks
A2B Analyzer System
The A2B Analyzer System is designed specifically for development teams servicing automotive OEMs, Tier 1s, and audio connectivity equipment suppliers. The deterministic nature of the A2B technology makes it particularly well-suited for automotive audio devices (active speakers, microphones) and newer applications such as ANC. The A2B Analyzer System consists of a compact hardware device, an accompanying software development kit (SDK), and network configuration and simulation tools.. The hardware device includes a USB 2.0 interface for PC connectivity for audio data and command/control functions. The small form factor device also features a variety of popular audio and connectivity peripherals.
-
product
OST-500 Optical Radiation Test System
Hangzhou Everfine Photo-E-Info Co., LTD
OST-500 is an optical radiation safety test system with 200-3000 nm wavelength range, refer to IEC/EN 62471/CIE S009, IEC/TR 62778, GB7000.1-2015, GB/T 20145, IEC/EN 60598 Annex P., IEC/EN 60598 Annex P. IEC/EN 60432, IEC/EN 60335, GB/T34075-2017, GB/ T34034-2017 2009/125/EC and other relevant standards. The system is equipped with a precision automatic dual-axis turntable, which can automatically find and obtain the maximum radiation position, and automatically measure the photobiohazard value of various lamps and lamp systems (LED products, ultraviolet lamps, lighting sources and lamps, etc.) at the maximum radiation position, and carry out safety classification.
-
product
Full Wafer Contact Test System
Fox 1
Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
-
product
Audio Volume Meter
AVM
This is a true RMS audio storage meter used to measure audio volume levels of live program material. Use it to periodically survey your system for high or low audio levels to prevent complaints about loud or un-even audio programming. You can use this meter to quickly locate and verify any objectionable signals levels and bring them into compliance.
-
product
Sound Level Test System
In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
-
product
Integrated 5G mmWave Test System
IQgig-5G
The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
-
product
Rotary Table Test system
The requirement was to develop a test system that can take very different test and programming times into account so that the hardware used can be used in the best possible way.





























