Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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3 Port Devices
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Teledyne Lincoln Microwave supplies 3 port circulators and isolators that operate from UHF to V Band. They are available in a range of different packages; planar microstrip, coaxial and waveguide.
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Industrial Flash & Memory Solutions
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Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Imaging Devices
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High quality imaging devices with double or simple telecentric objectives offering exceptional spatial resolution with high FOV. Dedicated to high quality measurements whatever your display size.
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CCD Device Handlers
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Exatron has been in a unique position to supply handling systems for the new CCD device market. Manufacturers of CCD devices came to Exatron when these devices were new, looking for custom handling applications, and Exatron responded by modifying its Model 3000B, 3000BL, 5000, 5080, and 8000 systems to accommodate CCD devices.
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Industrial Flash & Memory Solutions DDR3 Memory
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SQRAM offers DDR3 memory modules with Samsung or Hynix chips and DDR3L of low voltage 1.35v backward to 1.5V compatible with Intel and AMD platforms.
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Industrial Flash & Memory Solutions DDR4 Memory
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SQRAM DDR4 memory modules perform at superior speeds of up to 3200 MT/s, a 20% reduction in power consumption, and higher capacity than DDR3.
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LIN Interface Device
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LIN Interface Devices are bus interfaces for developing applications with the NI-XNET driver. The NI-XNET device-driven DMA engine couples the LIN bus to host memory to minimize message latency. You can import, edit, and use signals from LDF databases in integrated LIN databases. LIN Interface Devices work well for applications requiring real-time, high-speed manipulation of many LIN frames and signals, such as hardware-in-the-loop simulation, rapid control prototyping, bus monitoring, and automation control.
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HighFfrequency Test Devices
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VI Systems now releases engineering prototype samples of high performance transmitter and receiver optical subassemblies (TOSAs and ROSAs) for 25 Gbit/s and 40 Gbit/s applications and product development.
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Memory Tester for DDR4 DIMMS
RAMCHECK LX
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USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Reflective Memory PCIE card
PCIE-5565PIORC
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The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
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Test Devices
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qCf - quickCONNECT - efficient, accurate, safe!Measurements on internal components of the fuel cell and electrolysis
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Energy Monitoring Devices
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Mitsubishi Electric Automation, Inc
Monitors all energy assets on the plant floor with EnergyPAQ a scalable energy hub and smart energy control capable solution with an HMI you can customize to show critical energy data, alarms in real-time and serve energy data to an energy information layer reporting software.
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Low-Temperature Impact Device
DWC-1
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This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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Night Vision Devices
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Night vision devices are one of crucial surveillance technologies for defense/security sector. NVDs have also found mass applications outside defense sector. Testing NVDs is needed for both manufacturers, maintenance workshops and final users for a set of different and important reasons. Hi-tech test equipment can help significantly in manufacturing, maintenance, training, purchase optimization, and optimal use of night vision devices.
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16GB SO-DDR4-3200 1GbX8 1.2V ECC Samsung Chip
AQD-SD4U16GE32-SE
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16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, ECC.
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Sensors & Optical Devices
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Panasonic Automotive & Industrial Systems Europe GmbH
Panasonic manufactures a complete lineup of sensors for full-body tracking and gesture recognition, occupancy detection, light intensity, acceleration, object detection, and pressure measurement.
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Photonic Device Testing
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ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
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Metrology Device
XPLOR 100
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XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
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USB Device Servers
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Enable printers, scanners, disk drives, cameras, card readers, and virtually any other USB device to be shared over the network so that multiple users can access the same USB device.
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Semiconductor Memory Tester
T5851
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Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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MRAMs - Magnetoresistive Random Access Memory
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Teledyne e2v’s MRAMs type EV2A16A is an extended-reliability version of the MR2A16A from Everspin. It is the ideal memory solution for applications that must permanently store and retrieve critical data quickly. It perfectly suits the requirements of critical embedded applications such as avionic, aerospace and defence environments.
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Electricity Metering Device
Mk10D
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Built on the advanced Atlas metering platform, the Mk10D adds three 100A UC3 compliant relays into the meter which allows for disconnection and reconnection of electrical services remotely.
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Ubuntu Pro For Devices
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10 years of Expanded Security Maintenance Supporting Ubuntu Classic LTS, including 16.04, 18.04, 20.04, 24.04 Two times more security maintenance pack.
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System Devices for Radiomonitoring
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Monitoring stations need auxiliary equipment to ensure optimal alignment and control of the antenna or antennas or to provide users with RF signal filtering functions close to the antenna, depending on requirements. Customers around the world use the innovative system devices for monitoring stations from Rohde & Schwarz to meet these requirements. These devices stand for performance, quality, flexible deployment options and a wide range of possible configurations, which is why they are an optimum solution for any radiomonitoring application when used in conjunction with the other products in the Rohde & Schwarz radiomonitoring and radiolocation portfolio.
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Avionics/Vehicles Bus, Serial I/O, Shared Memory, and More
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Curtiss-Wright Defense Solutions
Curtiss-Wright offers a wide range of solutions for high-speed, low latency communications and shared memory products. These products are offered in a variety of form-factors including PMC, XMC, PCIe and PC/104 cards designed to support popular communications standards including 1553, ARINC 429, CANbus and Serial FPDP.
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Laser/LED Devices
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Whether you manufacture or sell CD and DVD drives, laser pointers, or Blu Ray discs - you are probably more than aware of the potential hazards of high-powered, bundled radiation in laser products. As an independent testing institute, TÜV Rheinland can check your products for full compliance. We can classify and certify your products in accordance with international standards and the prescribed DIN EN 60825 norm.
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Backend Test For Packaging Devices
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Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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PXI/PXIe High-Accuracy Multi-Measurement Device
PXM(e)7822
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The PXM Multi-Measurement Devices combine the functionalities of a 16 Bit digitizer, a 24 Bit multimeter, a timer/counter and a highly flexible trigger matrix in a PXI or PXIe device.
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Partial Discharge Simulation Devices
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Hangzhou Xihu Electronic Institute
Simulation device of cable PD faults, simulation device of switchgear PD faults, simulation device of GIS PD faults, simulation device of transformer PD faults.
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Standard Test Devices
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Zhengzhou SMS Electric Co.,Ltd
Fast, accurate verification to ensure that all devices work reliably.
