Probing
See Also: Probers, Probing Stations, Nano Probes
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Pilot H4 Next Automatic
The Pilot H4 Next series automatic version represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system.
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Automotive Back Probe Pins
142-5
Flexible 1.5 inch silicon pins provide easy back probing connections for DMM and Scope measurements
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FPGA Dynamic Probe for Xilinx FPGA
B4655A
Quickly access internal Xilinx FPGA signals Make incremental measurements in seconds, without changing design timing Access up to 128 internal Xilinx FPGA signals for each pin dedicated to debug Measurement can be either in State (synchronous) or timing (asynchronous) mode
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Temperature, Humidity, Bar. Pressure Transmitter
T7411-4
Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy. Built-in pressure sensor.
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The Nanoworkbench
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.
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In-situ Gas Analyzers
Real-time gas analysis directly within the processInnovative measurement technology that allows the devices to be mounted directly at the measurement site: In-situ gas analyzers take measurements directly within the process under system conditions. These analyzers are primarily characterized by their minimal maintenance requirements and extremely short response times. SICK's in-situ gas analyzers are available in two different versions:The cross-duct version for representative measurement results across the entire duct diameterThe measuring probe version, optimized for single-sided gas duct installation
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Voltage Probes
In addition to EMI measurement with LISNs (Line Impedance Stabilisation Networks, Artificial Mains Networks), Probes are used for Terminal or Line voltage measurement.
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Universal Measuring Device For Magnetic Fields
Teslameter M-Test MK4
The M-Test MK4 precisely detects and measures static or dynamic magnetic fields. The ~ 1 mm thick tangential probe allows precise, punctual measurements in hard-to-reach places, air gaps or on surfaces. The M-Test MK4 is particularly suitable for measuring permanent magnets or small ferromagnetic parts.
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Hybrid Socket
CSP/Ballnest
Any grid size available on 0.50mm pitch or larger. ZIF style socket using Aries solderless, gold plated pressure mount Spring Probe. The gold over nickel plated compression spring probes leave very small witness marks on the bottom surface of the device solderballs.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1Z-2-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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LCR-Reader-MPA: Ultimate All-in-One Digital Multimeter
LCR-Reader-MPA combines tweezer probes with a powerful LCR/ESR-meter that is able to determine the type of component and best test parameters before measuring with a 0.1% basic accuracy. The device will display the main impedance value, any secondary values such as ESR, Q or D, component type and test parameters used instantly on a bright backlit LCD display. The 1 oz. device is very portable and ideal for fieldwork.
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Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2J40
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Handheld Digital Multimeter, AC/DC Voltage, Continuity, Diode, 3.5, 2000, Manual, 250 V
72-13440
*Palm size digital multimeter with 2000 count clear LCD display*CAT II 250V environment safety rating*Manual functional select and manual range selection*2m drop test, precision protection*Auto backlight off*Knobs shift smoothly, in-line with ergonomics*Equipped with comfortable protective cover and test probe holder*Powered by AAA 1.5V x 2 batteries*Non-contact voltage (NCV) detection*12-month limited warranty *view Terms & Conditions for details
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Advanced Monitoring Probe
DVB-T/T2
Combined with a Network Monitoring System or not, the EdgeProbe Advanced provides a powerful broadcast network alert & diagnosis tool allowing DTV network operators to monitor global trends and anticipate potential failures.EdgeProbe Advanced is able to monitor DVB-T and DVB-T2 signals at transmitter outputs, through its RF inputs (up to 4 in 1RU), as well as at modulator input and at Head-End/distribution links, through its ASI and IP inputs.
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Cantilever Probe Card
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
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High 3.12 (88.00) - 8.00 (227.00) Bead Probe
BTP-72F-8
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Mixed Signal Oscilloscope: 20 GHz, 4 Analog Plus 16 Digital Channels
MSOV204A
20 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.54 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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6-12V Heavy Duty Circuit Tester With Long Probe
1668A
Peaceful Thriving Enterprise Co Ltd
Check on 6 and 12V systems. To indicate whether there is an electrical potential at any low voltage point in the system. By using the pointed contact tip to pierce insulation on cables, it will also indicate if current is present. This can be helpful when tracing faults or add cable to a circuit.
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Solar Cell Testers
Solar Cell Testers are integrated systems incorporating Solar Simulator and I-V Measurement systems. PET offers Standard and Advance IV Measurement software. PET Cell Testers are capable of measuring a diverse range of solar cell parameters such as Isc,Voc, Imax,Vmax, Pmax, FF, Rsh, Rs and η cell conversion efficiency, complete light and dark I-V curves. All that needs to be done to test a cell is to load the cell, make electrical probes contact and press “Measure” icon on the I-V Measurement System software. The software will automatically open the Solar Simulator shutter, perform the test and close the shutter after the test is complete. The design is modular in nature and can be easily upgraded. Some options can added at a later time.
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DH Series QuickLink Adapter Kit with 3 x QL-SI Tips
DH-QL-3SI
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Long Range Scanning
Our contract measurement services include a variety of short-range (< 20 feet) and long-range (20 to 900 feet) high definition technologies, which use both contact and non-contact processes. With over a decade of experience in long range scanner technologies, we have the experience to determine the most affordable approach to your project and the expertise to do the job right. Our tools for long range scanner services include portable CMMs (PCMM) – both touch probes and laser trackers – and 3D laser mapping scanners.
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Eddy-Current Sensors
Eddy-Current sensors are noncontact devices capable of high-resolution measurement of the position and/or change of position of any conductive target. Eddy-Current sensors are also called inductive sensors, but generally "eddy current" refers to precision displacement instruments (or nondestructive testing probes) and "inductive" refers to inexpensive proximity switches. High resolution and tolerance of dirty environments make eddy-current sensors indispensable in today's modern industrial operations.
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NTC Clamp Temperature Probe
Si-RM2
This Si-RM2 temperature probe accurately and simultaneously provides real-time superheat/sub cooling calculations. It measures temperature from -40 to 150 °C (-40 to 302 °F), and comes with wireless connection low energy.
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25T30-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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MSP Switch Probes
Switch point flexibilityDesigned for long life and reliable performanceVariety of tip options
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LPDDR3 178-ball BGA Interposer For Logic Analyzers
W3301A
The W3301A LPDDR3 rigid BGA interposer for LPDDR3 178-ball DRAM enables capture of simultaneous read and write traffic at data rates in excess of 1866 Mb/s. E5406A Soft Touch probes and U4201A cables connect the W3301A LPDDR3 BGA interposer into the U4164A logic analyzer module. The W3301A LPDDR3 178-ball rigid BGA interposer allows signal access to the LPDDR3 signals critical to your debug and validation effort through a U4164A logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR3 178-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR3 signals.
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High 0.75 (21.00) - 8.00 (227.00) Long Travel Bead Probe
BPLT-25HL-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
