EHF
extremely High Frequency in the range of 30 to 300 gigahertz.
See Also: Extremely High Frequency, Millimeter Wave
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Product
Embedded MXM GPU Module with Embedded NVIDIA RTX™ A1000
EGX-MXM-A1000
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- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82 x 70 mm)- PCIe Gen 4 x8 interface- 2048 CUDA® cores, 16 RT Cores, and 64 Tensor Cores- 6.66TFLOPS peak FP32 performance- 4GB GDDR6 memory, 128-bit- 192GB/s maximal memory bandwidth- 5-year availability
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Product
Standard 1.55 (44.00) - 3.20 (91.00) General Purpose Probe
HPA-50B
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 590Overall Length (mm): 14.99
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z-7-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 335 x 250 mm (wxd)
CMK-02
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25I8-10
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
ZIO Module With Two COM Ports And 32 Bit Programbale DIO
AX93285
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*Specification: 2 x RS-232, 32-bit programmable DIO*Dimension: 80 x 55 mm*Compliant Product: CAPA840, CAPA843, CAPA880, CAPA500, CAPA313
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Vibration Meters
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Overall Vibration Meter and Electronic Stethoscope, display unit with electronics includes: (2) "AA" batteries, (1) Sensor Pak, (1) Carrying Case, (1) Stereo Headphones with 3.5 mm "MINI" PLUG, (1) Owners Manual.
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Product
Probe Tip Ground Lead with 0.8 mm Socket
PK007-024
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Probe Tip Ground Lead with 0.8 mm Socket.
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Product
Kelvin Test Contactor/Probe Head
Gemini
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At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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Product
Displacement Transducers [mm]
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The Displacement Transducers are for use in precision measurement in the m range to simple displacement monitoring during manufacturing and assembly or the supervision of construction projects.
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Product
Four-Point Probe
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Materials Development Corporation
Materials Development Corporation offers the complete line of Four Point Probe systems from AIT. Systems are available to measue up to 12" diameter (300 mm) wafers as well as specialty systems for Photovoltaic wafers and substrates. For more information on these systems, contact MDC.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1T1-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Compact Case 20 EMC XS | Basic | 150 mm
20E-100-150
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The Compact Case 20 combines flexibility, practicability and intelligent design. Available in four different sizes and three different finishing options. Optionally also with EMC protection.
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Product
Position Sensing Solutions
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A complete line of laser beam positioning, measuring accurately down to fractions of a micron, wherein lower resolution allows measurements over wide areas up to 100 mm.
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Product
75/85/100 GHz, 1/2/4 Port, Electrical Remote Sampling Head Module
N1046A
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75 GHz, 85 GHz or > 100 GHz maximum available bandwidth (selectable option, upgradable)1, 2 or 4 channels per module User-selectable bandwidth settings starting at 60 GHz Electrical inputs: 1 mm female
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Product
Fingerprint Reader
UTC-P09-A0E
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Scan capture area of 14.6 mm (nom. width at center) 18.1 mm (nom. length). Pixel resolution of 512 DPI (average x, y over the scan area). 8-bit grayscale (256 levels of gray). ESD susceptibility >15 kV, mounted in case.
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Product
Alternate 0.50 (14.00) - 2.50 (71.00) General Purpose Probe
P2662BG-1Q2S
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Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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Product
16-element Si photodiode array
S12362-321
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The S12362/S12363 series is a back-illuminated type 16-element photodiode array specifi cally designed for non-destructive X-ray inspection. These are modified versions of our previous products (S11212 series: 1.575 mm pitch). The pitch has been changed to 2.5 mm. The back-illuminated photodiode array is also simple to handle and easily couples to scintillators without having to worry about wire damage because there are no bonding wires and photosensitive areas on the back side.
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Product
Standard 0.49 (13.89) - 2.50 (70.87) Battery Probe
CP-4C
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Current Rating (Amps): 10Average Probe Resistance (mOhm): 25Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 60Full Travel (mm): 1.52Recommended Travel (mil): 40Recommended Travel (mm): 1.01Overall Length (mil): 311Overall Length (mm): 7.90Overall Length Remark: Overall length does not include tail.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2J40-2
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Probe Card
T90™ Series
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The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Product
Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
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The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Product
High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72I40-8
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
SPL-03C-153 Step Probe
SPL-03C-153
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Current Rating (Amps): 6Average DC Resistance lower than (mOhm): 50Test Center (mil): 125Full Travel (mil): 200Full Travel (mm): 5.08Recommended Travel (mil): 127Recommended Travel (mm): 3.23Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1B-4-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Measuring Device For Measuring Residual Magnetism
Teslameter M-Test LL
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Measure residual magnetism on ferromagnetic materials precisely and reliablyquick detection of residual magnetismreproducible measurement results through automatic storage of the maximum valuesdefined measuring distance of 0.5 mm from the Hall probe to the measuring surfacemeasuring static and alternating magnetic fieldsselectable units: A / cm, Gauss, mTwear-resistant test sample
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Product
Averaging Axial Extensometers for Large Compression Samples
Model 3542RA
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Jinan Testing Equipment IE Corporation
Designed primarily for compressive strength tests on rock, concrete and other large compression samples, this model measures axial strain on opposite sides of the test specimen, and the output is an average of the two readings. Gauge lengths from 1 to 8 inches (25 to 200 mm) and measuring ranges from 0.050 to 0.250 inches (1.2 to 6 mm) are available.
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Product
Adapter, 2.4 mm (m) to 2.4 mm (m), DC to 50 GHz
11900A
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The Keysight 11900A is a metrology-grade, 2.4 mm male to 2.4 mm male adapter with dc to 50 GHz operation.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1I40-6
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
