Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 5.82MΩ
40-252-052
The 40-252-052 is a programmable resistor module with 1 channel which can be set between 3Ω and 5.82MΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Dynamic Component Test Systems
RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Standard Products
SBIR offers an extensive line of reliable, high performance test equipment used to characterize and calibrate IR, Visible and Laser systems. Products include blackbodies, visible sources, target wheels, targets, collimators, target projectors, laser test modules/systems and IRWindows™ software for automated testing. These modular, cost effective instruments are user-friendly and easily integrated into automated test systems. For more information, including printable data sheets, select a product from the list.
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Wireless Battery System Tester
EECS550
Snap-on Tools has launched the new Snap-on EECS550 Wireless Battery System Tester that eliminates the need for a second technician. “The EECS550 maximizes manpower and gets the critical job of battery system testing done with just one set of hands,” says Dave Brekke, product manager for Snap-on. “Snap-on has listened to techs in shops where this work is a daily task. The tester will change the way techs are able to service cars, trucks, motorcycles, golf carts, ATVs and more. From the strong, built-in magnets that hold the tester in place to the easy-to-see, back-lit screen that displays in eight languages and reports battery, starting and charging system conditions, this tester takes productivity to the next level.”
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Computer-Based Instruments
GT210PXI
GuideTech’s GT210PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system with optimal cost. The ability to precisely resolve frequency and time yields both increased accuracy as well as reduced measurement time. For example, with the GT210PXI-1 you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.
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Wireless Connectivity and IoT Test System
IQxel-M4W
Suitable for the lab or manufacturing environment, the IQxel-M4W 6G is ideal for RF testing of wireless connectivity and IoT products. The platform’s flexible software supports the most prevalent wireless connectivity standards: WLAN 802.11ax (Wi-Fi 6) and legacy (802.11a/b/g/n/ac), Bluetooth® Classic and Low Energy (Bluetooth® LE) as well as Zigbee/Thread, Z-Wave, LPWAN technologies (Sigfox, LoRa) and cellular IoT technologies (NB-IoT, LTE-M, 5G) as well as navigational technologies.
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Compliance Test Systems
LMG Test Suite
ZES ZIMMER Electronic Systems GmbH
The ZES ZIMMER test system LMG Test Suite tests in accordance with the currently valid version of EN 61000-3-2/-12 or EN 61000-3-3/-11 and also supports measurements per ECE R-10.4 Annex 11 (e.g. electromagnetic compatibility of vehicles). As a manufacturer of precision power measurement technology, we are represented on the international standards committee. As a result, changes in standards are immediately incorporated into our test systems.
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Generators and Sources
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Vibrating Sample Magnetometer
VSM
The VSM (also named M-H CURVE Hysteresis Graph TEST SYSTEM ) can be used for the measurement of the basic magnetic properties of the magnetic materials. Such as the Hysteresis loops of the materials, Magnetization curve, Warming Curve , Warming /Cooling curve, Cooling curve and the changes of the temperature as time goes away , then we will get some Magnetic parameters such as the Saturated strength of the magnetization, the left strength of the magnetization , Coercive force, the Max of Magnetic energy product,the Curie temperature and the Magnetic conductivity(the Initial Magnetic conductivity is included ). It can also measure the magnetic materials such as the powder, the particles, the films, the liquid and the massive.
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PXI 5W Programmable Resistor Module, 1-Channel, 2Ω to 13.6Ω
40-252-131
The 40-252-131 is a programmable resistor module with 1 channel which can be set between 2Ω and 13,6kΩ with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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High Volume Semiconductor Substrate Interconnect Tester
GATS-2100
Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors.The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
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Booster and In-line Amplifier
Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.
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Battery Management Systems Testing
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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MU Cable Tester System
16814
The MU Locomotive Trainline/Cable Test System (MU Test System) can perform shorts testing, continuity testing, and ground-leakage testing on each of the 27 pin Multi-Unit Trainlines normally found on Freight Locomotives. The MU Test System is comprised of two identical tester units. Each unit is installed in a rugged, water resistant Pelican case. Each unit contains an MU cable receptacle that mates with a 27 pin MU jumper cable. A snap-on vinyl pouch on the outside cover of each unit provides storage for the battery charger/power adapter and the chassis test lead. The enclosure cover hinges separate from the test unit as the cover is opened; this removes the cover completely to allow free access to the MU cable receptacle and the control panel.
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Ultra-Agile Frequency Synthesizer
Corech’s Ultra-Agile Frequency Synthesizer packs impressive low phase noise of -100dBc/Hz@10kHz@20GHz, low spurious of -65dBc, high temperature and corrosion resistance, long operating life, temperature uniformity, and good thermal conductivity. These outstanding performance make it suitable for high-reliability and environmentally stressful applications including communication systems, test and measurement equipment, radar systems etc.
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Engineering Services
Analysis, Integration & Design, Inc.
Simulation SystemsAutomatic Test Systems (ATS)Data Acquisition & Control SystemsCommunications SystemsAIDI provides complete system development, produces software applications, facilitates integration, and provides deployment support. We integrate with customer needs and requirements to provide entire solutions or work within existing processes to reinforce teams and efforts already underway. We listen and deliver.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Hall Effect Measurement system
HMS-3000
Hall Effect Measurement System is very useful for measuring Carrier Concentration, Mobility, Resistivity and Hall Coefficient that should be pre-checked in order to grasp the electrical specifications of semiconductor device. Therefore, it is essentially required system to understand the electrical characteristics of semiconductor device.Ecopia’s HMS series consist of constant current source , terminal conversion system by Van der Pauw technique, low temperature(77K) test system and magnetic flux density input system. So, it is well-established system that has all the things needed to Hall Effect Measurement System.
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PCI Precision Resistor Card 6-Channel, 2.5Ω To 201kΩ
50-297-041
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 239Ω
40-252-113
The 40-252-113 is a programmable resistor module with 2 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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XCITE 1100 Laboratory Series
The Xcite 1100 Laboratory Series is the most popular of the Xcite product line because of its large force capacity and broad frequency range compared to its extremely compact size. The 5 GPM 3-Phase hydraulic power supply used in the system provides a high level of low frequency displacement response for testing system subassemblies and non-linear structures such as suspensions and elastomeric dampers. The small piston area of the exciter and the high performance servovalve combine to provide excitation to over 1000 Hz allowing structure borne noise path evaluations.
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AOI & SPI, Test Systems
SigmaX SPI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The SigmaXs inspection technology is unaffected by varying materials, surface conditions, or colors. The system profiles the board to generate accurate 3D shapes far superior to other brands and technologies.
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - United Kingdom 240VAC
781630-06
The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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PCI Precision Resistor Card 3-Channel, 3Ω To 5.82MΩ
50-297-152
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Modular Hydrostatic Test System
Our modular hydrostatic test chambers are designed with open ends to accommodate the connection to similar units for the purpose of lengthening the enclosed test area. The modular test system starts with a base unit with complete pump system, gauges and controls mounted on the 60” x 24” x 18” test chamber. If longer test lengths are required, simply add another test chamber to double, triple or quadruple the test length area. Specify your particular requirements at our Customization Page.
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PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Fully Programmable Digital Design with Wireless Remote Control
VLF E Series
The VLF E Series uses a state-of-the-art, switching power supply design with wireless computer controls. Equipped with HVI’s E-Link software, the E Series stands among the most advanced cable testing systems available. Our customers praise its flexible data capture and reporting capabilities, full remote operation via XBee wireless technology, and seamless tan delta testing with HVI’s TD units.
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PXIe-2738 , 256-Crosspoint, 8x32, 2-Wire PXI Matrix Switch Module
782835-38
256-Crosspoint, 8x32, 2-Wire PXI Matrix Switch Module—The PXIe‑2738 is a high‐density 8x32 PXI matrix switch module designed for routing signals within automated test systems and using electromechanical relays to perform immediate switch operations. It also offers features to monitor the health of deployed systems and plan for predictive maintenance, including onboard relay count tracking, a temperature sensor, and functional and resistive relay self-tests available through the NI Switch Health Center.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 2.5Ω to 102kΩ
40-251-140
The 40-251-140 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
