AFM
Nanometer size probe which scans for surface deflections.
See Also: Atomic Force Microscopes, SPM
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Nanoscale Microscopy Standards
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The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Nanopositioning Systems
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Mad City Labs'' nanopositioning systems move and maintain the position of objects with sub-nanometer precision and high stability. Applications for nanopositioners include super resolution microscopy, high speed confocal imaging, AFM, NSOM, SPM, optical trapping, fiber positioning, single molecule spectroscopy, single molecule/particle tracking, high resolution optical alignment, nanoscopy and lithography.
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AFM-Raman for Physical and Chemical Imaging
LabRAM Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.
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Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Low-noise High-voltage Amplifier For Tube-scanners -
HV200/5
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The HV200/5 is a high-precision HV-amplifier designed for the control of tube scanners. It takes three input voltages In X, In Y and In Z (-10 V to + 10 V), amplifies them separately (input gain switches: x1, x2, x5, x10, x20) and adds an offset voltage between -10 V and +10 V. In a 2nd stage, the signal is amplified by a factor of 20. This enables its use as HV amplifier in scanning image acquisition applications, such as STM or AFM, with the capability to shift the scan range in high resolution imaging.
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SPM Probes
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AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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AFM & NSOM
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A new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation.
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Near-Field Detection Module for Imaging
Reflection
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Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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High Performance Power Analyzer
AFM-8A
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AFM-8A has Developed for AFC*(Auto Frequency Control) high performance measurement and frequency update, its update up quickeer than 100mSec. multifunction power analyzer provides high-accuracy measurement and is designed for single phase and three phase application. It includes 4 Digital inputs, 4 Relay outputs, and a RS-485 Modbus RTU Communication port. The user can choose one more communication port, and 2 Analog outputs for output expansion.It provides measure voltage and current of the 2~63 harmonic, and it shows CO2 emissions, which is suitable for power monitoring, management and analyze power quality. It has TOU (time-of-use) function and 4MB Flash memory capacity, allowing users to record data for a long time. It also has a software line adjustment function to reduce the on-site line adjustment work.It has the functions of waveform capture and recording, power record, and event record, which can be used for multifunction power analyzer.
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AFM Optical Platform
OmegaScope
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The OmegaScope is a state-of-the-art turn-key solution that combines Optics and ultra-resolution multi-range research AFM. The OmegaScope AFM is an advanced research instrument that provides path for researchers in spectroscopy and photonics. It is available in reflection configurations providing direct top and side optical access. The flexibility of the OmegaScope platform offer almost endless possibilities in correlation of high spatial resolution spectroscopies (Raman, Photoluminescence, Fluorescence) and AFM imaging modes.
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Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Surface Analysis
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Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
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Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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Near-Field Detection Module for Imaging
Transmission
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Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Life Sciences Applications
LS-AFM
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The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.
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Air Flow Sensor
ENVIROMUX-AFM
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Reliable mechanical solution for monitoring air flow. Reacts to any condition causing insufficient flow of air such as malfunctioning cooling fan, increased friction, or physical blockage. Ideal for direct monitoring of a cooling fan, HVAC duct, or under a raised floor. Switch contact is closed when air flow is >8.2 ft/s. Connection: 2x single strand AWG26, length 18 in. Maximum cable length: 1000 ft (305m). Regulatory approvals: RoHS.
