Filter Results By:
Products
Applications
Manufacturers
-
product
Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
-
product
Rapid Scanning Auto-Correlator / Cross-Correlator
FR-103XL
The FR-103XL is a dispersion-free Autocorrelator/CrossCorrelator for monitoring the temporal width of ultrashort optical pulses. Offering unsurpassed sensitivity and resolution, it is compact and easy to operate. The FR-103XL is ideally suited for the measurement weak signals in optical telecommunications, as well as pulses from other mode-locked lasers such as Ti-Sapphire.
-
product
TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
-
product
IR Digital Laser Thermometer
214L
With a user switchable measuring range of -35°C to 365°C or -31°F to 689°F, a digital display of the temperature is produced in less than one second.Non-contact technology with laser spot indicatorºC / ºF user switchableFast, 1 second scanning of any surfaceMeasure objects as small as 25mm (1”)Distance-to-Target Ratio of 8:1Easy to read LCD display
-
product
Interference & Compatibility Evaluation System
ICEy
Schmid & Partner Engineering AG
ICEy is the most advanced reactive near-field E/H-field scanning system for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics. ICEy is the only system that provides accurate EM measurements traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results.
-
product
20 Channel Multiplexer (2/4-wire) Module for 34970A/34972A
34901A
The Keysight 34901A module for the 34970A/34972A Data Acquisition/Switch Unit is the most versatile multiplexer for general purpose scanning. It combines dense, multi-function switching with 60 channel/second scan rates to address a broad spectrum of data acquisition applications.
-
product
VHF Radio Direction Finding Antennas
Vector-Finder Series
The Vector-Finder Series of VHF direction finding antennas provide a compact, lightweight, active antenna, suitable for use in the field with handheld transceivers and scanning radios. The mechanical design allows the sense antennas to be folded back to provide a compact unit, easily stowed or transported in any vehicle. The system interfaces with any FM receiver or transceiver via the antenna jack and the earphone jack. Several different models are available to suit your pocketbook or unique field application, all of which operate on the phase shift technique. The VF-142Q models incorporate left-right indicators as well as an audible response from which the user can determine the true direction of the radio signal. The other types utilize the audible response generated by the equipment and heard on the user’s receiver or transceiver. All models operate from a 9-volt battery.
-
product
Automatic Cooling Attachments
TAC-60L/60i
The DSC-60 plus /60A plus (Differential Scanning Calorimeter) can use the "liquid nitrogen cooling type TAC-60L" or "electric cooling type TAC-60i" as "attachments for low-temperature (cooled) measurement".
-
product
Focus Control And Stabilization
Applied Scientific Instrumentation
The CRISP system is designed to maintain focus over time i.e. compensate for thermal & other factors that may cause the sample to drift out of focus over time. It also can be used to maintain a given focal point while scanning the sample in XY. If you are looking to find the optimal focal point while scanning through the sample in Z phase.
-
product
Active Scanning Technology
ZEISS invented scanning in response to the drawbacks of single-point measurement nearly 50 years ago. This game-changing development enables the capture of thousands of data points within just a few seconds for truly reliable tactile quality assurance. It also saves time and money by delivering the high throughput and accurate results that are vital for manufacturing.
-
product
Multiphoton Laser Scanning Microscope
FVMPE-RS
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
-
product
Multiplexer
SC6540
Our patented SC6540 modular scanning matrix pioneered the largest productivity improvement in the electrical safety compliance industry in years. With up to 16 independent high voltage or high current channels in a convenient 2U design, the SC6540 can be customized in 10 different configurations for multi-point Hipot, Ground Bond, Insulation Resistance and Leakage Current testing.
-
product
3D Scanning System
CyberGage360
Unprecedented combination of speed, accuracy and one-button simplicity for non-contact automated 3D scanning inspection.CyberGage360 dramatically Speeds Up Quality Assurance of Incoming Parts Inspection & In-Process Inspection of components on the manufacturing floor; Lowers Cost of Quality & Speeds Up Product Time-to-Market. Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
-
product
CT-NANO
The CT-NANO is a fully operating scanning electron microscope with capabilities of Nano-CT measurements on specimen like light-metal-alloys and fiber composites.
-
product
Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
-
product
2D Automated Optical Inspection Systems (2D-AOI)
BF1 Series
Saki’s unique line scanning technology and coaxial overhead lighting enables high-speed accurate inspection.
-
product
Scanning Probes
Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
-
product
IR Linear and 2D Sensor Array Modules
Excelitas offers Linear and 2D IR Imager Arrays based upon our Thermopile Technology. All Arrays are provided as plug-and-play Modules featuring a sensing chip, robust metal housing with focusing lens, a PCB with microprocessor for calibration and bus interface and a quick connector for streamlined plug-and-play integration. We offer 8-pixel, 16-pixel and 32-pixel Linear IR Imager Array Modules for field-proven effectiveness in scanning presence detection, non-contact temperature measurement, smart-home products, and office electronics. Custom solutions also available upon request.
-
product
Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
-
product
Ambient Pressure Photoemission Spectroscopy With Nitrogen Environment
The APS04-N2-RH incorporates a tuneable deep ultra-violet (UV) source outputting 3.4 - 7.0 eV, for absolute work function and highest occupied molecular orbital (HOMO) measurements, a surface photovoltage spectroscopy (SPS) module outputting 400 - 1000 nm for Voc and Eg measurements, together with a 50 x 50 mm scanning area for planar relative work function measurements (Fermi level).
-
product
Flexible AFM
SA-AFM
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
-
product
kSA Scanning Pyro
For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
-
product
Flying Probe Electrical Testers
Gardien has been present in the PCB industry since the advent of the personal computer. In our beginning Mania, the company that pioneered some of the first electrical grid testers used by PCB fabricators. We still produce class leading equipment to this day, such as our line of Gardien Flying Probe Testers and our Acceler8 Scanning System.
-
product
Universal CMM Software Module
Verisurf CMM
Plug and play CMM communication for Hexagon Dea, Leitz, Mitutoyo, Wenzel, Pantec, Nikon, LK or Zeiss™️ machine controllers, as well as Renishaw, Tesa, Hexagon Leitz or Zeiss™️ head controllers.Optional support for scanning probes and error mapping compensation for geometric, volumetric, orientation, positioning and kinematic errors in the CMM structure that affects accuracy.
-
product
COMPUTER MONITOR TESTER
MT160
Test a wide variety of PC & Mac computer monitors-all in one unit. Extended scanning formats range from 15.7K to 80 KHz.
-
product
Ultra-High Vacuum
KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
-
product
Scanning Mobility Particle Sizer Spectrometers
TSI's Scanning Mobility Particle Sizer (SMPS™) spectrometers are high resolution sizers that have long been hailed as the researcher's choice for particle size characterization. Our SMPS™ systems are in use around the globe for hundreds of applications, providing the high-resolution data that researchers and other investigators depend upon.
-
product
3D Software
Along with manufacturing professional 3D scanners, Artec develops smart 3D scanning software. Meticulously designed to meet the needs of both new and experienced users alike, it is the best choice for any application.
-
product
RF Safety Monitoring
MVG EME Guard XS 40GHz
EME Guard XS 40 GHz has been specifically designed to cover the new 5G millimeter wave bands. This RF safety tool is important for keeping those working close to RF emitters safer. It is easy to use, continuously scanning electromagnetic waves, and alerts the user when acceptable pre-selected limits have been exceeded.
-
product
3D Scanner Software
3DX Engine
*Easy step-by-step user interface, low learning curve, suitable even for first time users*Recovery mode always protects all your scan project and data from computer crash and power outage.*Texture Scanning (OBJ format)
