Filter Results By:
Products
Applications
Manufacturers
Semiconductor Test
prevails upon the DUT to demonstrate It's fulfillment of test requirements.
See Also: ATE
-
product
Differential Picosecond Pulse Generators
PicoSource PG900 Series
The fast-transition pulse can stimulate a transmission path, device or network with a broad spectrum signal in a single instant. Such a pulse is very useful for many of the high-speed broadband measurements that we need to make; for instance in time-domain reflectometry, semiconductor test, gigabit interconnect and port test and in radar.
-
product
High-Density Precision SMU (10 PA, 30 V)
PZ2131A
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2131A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2131A suitable for noise-sensitive applications such as quantum computing as well.
-
product
Low Leakage Switch Mainframe
B2201A
The B2201A reduces the cost of test by enabling characterization tests to be automated, with only slight compromise to the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.
-
product
Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
-
product
PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
-
product
5G Testing
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
-
product
µHELIX® Test Probes
Series S200, S300, S400, and S500
Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
-
product
PXI-5671, 2.7 GHz RF Vector Signal Generators
779079-04
2.7 GHz, Digital Upconverter Included, PXI Vector Signal Generator—The PXI‑5671 features quadrature digital upconversion, which reduces waveform download and signal generation time. It is a general-purpose vector signal generator that can generate standard modulation formats such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM. The PXIe‑5671 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as emerging areas including software-defined radio, radio frequency identification (RFID), and wireless sensor networks. For specific communications standards, you can use various software add-ons to generate modulated signals according to standards such as WCDMA, DVB‑H, and ZigBee
-
product
Semiconductor Device Testers
are particularly suitable for certain semiconductor test requirements, but other models may also be of interest. Our knowledgeable application engineers can guide you to the most suitable model.
-
product
Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
-
product
Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
-
product
Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
-
product
Probe Card Analyzers
PB6500
The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB.
-
product
Test Contactor/Probe Head
Hydra
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
-
product
PXIe-5672, 2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator
779900-01
2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator —The PXIe‑5672 features quadrature digital upconversion, which reduces waveform download and signal generation time. It is a general-purpose vector signal generator that can generate standard modulation formats such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM. The PXIe‑5672 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks. For specific communications standards, you can use various software add-ons to generate modulated signals according to standards such as WCDMA, DVB‑H, and ZigBee.
-
product
PXI Waveform Generator
PXI Waveform Generators can produce precise waveforms including sine, square, triangle, and ramp as well as arbitrary, user-defined waveforms using sequences of data or streaming continuously from a host or peer-to-peer instrument within the PXI system. These instruments are ideal for tightly synchronized, mixed-signal test systems in scientific research or test of semiconductor devices, consumer electronics, automotive, and aerospace/defense.
-
product
ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
-
product
Air Particulate Counter
CHY002
Using import semiconductor laser tube and import semiconductor photosensitive tube, assure sensitivity and response speed.Using import micropump，assure sampling volume steady，reduce noise.The key component-light scattering sensor obviously eliminate intracorporal stray light, improve SNR, test result more precise and reliable.The light scattering sensor got Chinese patent.Confidence measurement of this instrument，According to GB/T6167-2007 Standard，realize auto estimate clean class, creatively to auto estimate ≤9 location points clean class.1000 records stored, free to check previous data.User can optional PC data analysis software, realize data management.User can choose humidity sensor (optional accessories).Sampling volume display as digit, more intuitive and precise.“Measurement Number”function，realize multipoint management.Lithium battery，more safety，continuous working 6 hours.
-
product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
-
product
Semiconductor
The semiconductor industry faces continuous pressure to reduce device size and costs while improving performance and reliability. Semiconductor, test and assembly automation manufacturers demand the same improvements from the motion technology which drives it. Haydon Kerk Pittman continues to develop new technologies in motors, lead-screws, gears, encoders, actuators, slides, drives and complete sub-systems that increase operational speeds and accuracy while lowering the cost of ownership.
-
product
Goniophotometer
Hangzhou Hopoo Optoelectronics Technology Co., Ltd
This system uses the method of fixing the detector and rotating the lamp under test to measure the light intensity distribution of the light source or lamp under test in all directions in the space. The main shaft and the lamp shaft adopt the conductive slip ring with precious metal fiber point brush structure, which can run 360 degrees continuously without backlash for measurement. There is no need to rotate back and forth to prevent winding and never winding. According to the requirements of the measuring lamps, the system can be configured as a double-column B-β test scheme or a single-column C-γ test scheme. Used for LED lamps (semiconductor lighting), road lamps, floodlights, indoor lamps, outdoor lamps, etc. and LED, energy-saving lamps, fluorescent lamps, incandescent lamps, HID lamps and other light sources of spatial luminosity distribution
-
product
AMIDA ATI 600 Tester
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
-
product
DFT Consulting
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
-
product
Air-Cooled Universal Test Platform
Diamondx
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
-
product
WaferPro Express On-Wafer Measurement Program Software
WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
-
product
Electronic Component Testing Services
New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
-
product
Function/Arbitrary Waveform Generators
Scientech Technologies Pvt. Ltd.
An Arbitrary Function Generator or an Arbitrary Waveform Generator has many applications like Embedded and Semiconductor Test Applications, RF Related Applications, Automotive Applications, Education-Related Applications, Medical Applications, Industrial Applications and Research Applications. Thus, Scientech Technologies has its customers from all disciplines and areas and thus it makes Scientech one of the biggest arbitrary function generator supplier.
-
product
Design-for-Test And Semiconductor Data Analytics
Mentor’s comprehensive solution for IC test, including best-in-class design-for-test tools and test data analytics that help ensure the highest test coverage, accelerate yield ramp and improve the quality and reliability of manufactured parts.
-
product
Semiconductor Test
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
-
product
Constant Temperature Humidity Test Chamber
Constant Temperature and Humidity Test Chamber from Weiber are environmental test chambers, designed to simulate constant climatic conditions for testing a wide variety of products for their quality, performance, shelf life and stability. They are used to simulate constant temperature and humidity conditions, thereby creating a physiologically ideal environment for product testing. These equipments are most commonly employed for testing electrical devices, electronic parts and components, instruments, biological samples, food items and other manufactured and processed goods and find widespread usage in scientific research organizations, semiconductor industries, material research institutes and other industrial and manufacturing units.
