BER Test
Bit Error Rate Testers measure data integrity and express the ratio of received bits that are in error relative to the amount of bits received.
See Also: BER Testers
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Product
Error Distribution Analysis Package For M8000 Series BER Test Solutions
M8070EDAB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070EDAB Error Distribution Analysis package offers features like burst mechanism detection and analysis, frame loss ratio estimation and error mapping.For instance, you can easily estimate your FEC decoder margin or find the root cause of systematic errors by exploring the error map. The plugin also supports the use of real-time scopes as error detector.
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Product
Adjustable ISI Channel Emulation Package for M8000 Series BER Test Solutions
M8070ISIB
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Simplify receiver testing by offering unprecedented flexibility for handling test channels.
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Product
Advanced Measurement Package For M8000 Series Of BERT Test Solutions
M8070ADVB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.
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Product
Bit Error Ratio Testers
M8000 Series
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Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Product
GAOTek Handheld Gigabit Ethernet Tester
A0060001tek
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GAOTek Handheld Gigabit Ethernet tester is designed for installation and maintenance of 10 M/100 M/1000 M Ethernet networks. It combines the functions of network testing, data packet capture, traffic generation, cable testing and BER testing into one unit. It also integrates full RFC-2544 and Y.1564 tests. Featuring an ergonomic design and 5.0 inch LCD color touch screen, this Ethernet tester helps the front-line field workers to analyze the network quality and locate faults rapidly. Test results can be shown graphically and numerically.
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Product
Ethernet Tester
GAOTek Gigabit
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GAOTek Gigabit Ethernet Tester is a handheld tester for installation, commissioning and maintenance of 10M/100M/1000M ethernet networks. By combining network performance test & monitoring, data packet sniffing, traffic generation, cable test and BER test in one unit. It is widely used in testing BER of layer 1, layer 2, layer 3, and full-featured RFC-2544 and Y.1564 testing. It can help the front-line field technicians analyze the network quality and locate the fault rapidly.
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Product
Gigabit Ethernet Tester
GET-100
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GET-100 is a handheld 10M/100M/1000M gigabit Ethernet tester, used for the Ethernet installation, operation and maintenance services.The GET - 100 design in a small and portable device which provides packet capture, network monitoring, networkperformance testing, data generation, test leads and error test functions in an organic whole unit. It is widely used in network layer 1/2/3 BER test and RFC - 2544 test. GET-100 help maintenance people to quickly locate fault and analysis network
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Product
RF Noise Source
NS-3
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The NS-3 Broadband RF Noise Generator provides an extremely flat AWGN (Additive White Gaussian Noise) signal from 5 to 2150 MHz. The output level adjusts in 0.1 dB steps over a 30 dB range.The bench-top configuration is standard and an optional two unit rack enclosure is available. The RS232 or USB remote control interface simplifies its use in automated test and factory ATE environments. The NS-3's combination of range, versatility and value make it the ideal general purpose broad-spectrum signal source for bench and ATE applications, including C/N, BER, MER, PER testing and rain fade simulation.
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Product
Automotive Ethernet Rx Compliance Software
AE6910R
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Unlike CAN, LIN, or MOST, the IEEE standard for automotive Ethernet demands rigorous compliance verification using specific test cases. The test requirements include complex measurements: vector network analysis with S-parameters, bit error rate (BER) test, and protocol analysis of high-speed digital signals.
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Product
Bit Error Rate Testers
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The FarSync BERT Tester provides a comprehensive, simple to use, line testing utility for asynchronous and synchronous lines. Standard BER test patterns are used with real time error counters, user controlled error injection, full line test statistics and APIs.
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Product
Variable Attenuators
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Variable attenuators are an integral part of most BER testing and EDFA characterization setups. All of EXFO's modular (IQS line) and benchtop variable attenuators are built for top performance and pinpoint accuracy. Each model offers a distinct set of features and specifications to suit various testing needs.
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Product
AXIe M8000 Series of BER Testers
Bit Error Rate Tester (BERT)
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Product
Bit Error Rate Testers
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The Tektronix BERTScope® and PatternPro® families provide a range of signal conditioning and BER test solutions from 1.5 Gb/s to 40 Gb/s on 1-4 channels and deliver the test and measurement industry’s broadest serial communications test portfolio of Bit Error Rate Tester products.
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Product
Test Solution Offering BER Testing
Eye-BERT Micro LR
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The Eye-BERT Micro LR is a low cost, easy to use test solution offering BER testing at any rate between 6.312 and 125Mbps on either optical or electrical interfaces. Features include: continuously variable bit rate, user programmable pulse generator, internal CDR with retimer mode, bit rate measurement, and recovered clock output. The Unit is supplied with anti-skid bumpers for bench use, and is small enough to be integrated into larger systems for dedicated link verification.
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Product
MIPI Receiver Test Solution
M8085A
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The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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Product
VITA 57.4 FMC+ HSPC Loopback Card
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Samtec's VITA 57.4 FMC+ HSPC Loopback Card provides FPGA designers an easy to use loopback option for testing low-speed and high-speed multi-gigabit transceivers on any FPGA development board or FPGA carrier card. It can run system data or BER testing on all channels in parallel. This makes evaluation and development with an FPGA much easier and is an ideal substitute for 28 Gbps test equipment.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Research & Electronic Test Products
test
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Infotainment Test for Automotive Applications
test
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Regenerative Battery Pack Test System
17020
Test System
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
