Static Analysis
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Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Electronics Failure Analysis System
Sentris
Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Ionization Anti Static Blower
Ionization or anti static blowers are the most versatile ionizer to control or remove static electricity from plastic, paper, glass and other non conductive materials. This static control blower offers the ability to cover a large area cost effectively. This static control equipment is an excellent choice to reduce static electricity and reduce operator static shocks and production applications needing large area coverage.
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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CD Measurement and Advanced Film Analysis
FilmTek CD
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Spectrum Analysis, Up To 13.5 GHz
S930901B
The S930901B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 13.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Single-Phase Static Switches
ISSF COMPACT
ISSF 'COMPACT' series circuit breakers are electrical devices used to interrupt or connect the flow of current in an electrical circuit. They are designed to provide high reliability and protection in a compact size. They overcome the limitations of electromechanical switches in many difficult and demanding applications, such as the control of high-power motors, transformers, tungsten lamps, heating elements, and electric ovens.
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Spectrum Analysis For P50xxB Up To 20 GHz
S970904B
Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Spectroscopy, Elemental & Isotope Analysis
Research, production and analytical laboratories worldwide rely on us for rapid, efficient qualitative and quantitative analysis. Our innovative instruments and user-friendly software serve a range of industrial, educational, environmental and health markets. We offer a comprehensive portfolio for the quantification and identification of trace elemental species at ppm to sub-ppt levels in addition to isotopes. We also provide a wide range of lab-based and handheld instruments employing analytical techniques including XRF, FTIR, NIR, Raman spectroscopy, IRMS, ICP-MS and more.
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Video Quality Analysis Systems
ClearView Extreme 8K and 4K Systems
Highest Resolution Video and Audio Quality Analyzers with 12G-SDI Interfaces and ST 2110 Networking Option
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Dynamic Signal Acquisition and Analysis
m+p Analyzer systems are available for field and laboratory use from 4 to many hundreds of measurement channels. From gathering simple time history data to narrowband (FFT) spectra, fractional octaves, wavelets, shock response spectra and much more, m+p Analyzer real time analyzers can be used with a wide range of instrumentation hardware including our own m+p VibPilot, m+p VibRunner and m+p VibMobile systems, National Instruments (CompactDAQ USB, PCI, PXI) and VTI Instruments (PCI). Low cost portable instruments to systems for distributed measurements can be configured for maximum flexibility. Measurement data from all sources are stored in a common format so it is easy to compare and handle results from any measurement source.
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Stress Analysis Strain Gages
Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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Marine Seismic Systems Analysis Software Suite
Testif-i Marine
Testif-i Marine is a comprehensive software suite designed specifically to process test data from marine acquisition systems to ensure the integrity of your recorded data.
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Particle Analysis for Liquids
With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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Network Analysis Solution
IOTA
IOTA is a complete network analysis and troubleshooting solution for a variety of use cases in small, mid-size enterprises, remote sites, and small data centers. It is a versatile integrated solution, combining TAP, storage, and analysis capabilities in a single portable device.
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Partial Discharge Measurement and Analysis System
UHF 800
Our UHF 800 is a system for measuring and analyzing partial discharges in the ultra-high frequency (UHF) range in testing environments with high levels of external noise.
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Winmeter Battery Analysis Software
Explorer Technology Group (ETG)
The Winmeter Battery Analysis Software enables the user download and integrate data from the DMA-35n-BATT, DSG-30 or DLV-30 products and produce text and graphical battery analysis reports. With these reports, the user can quickly identify batteries that are likely to require preventative maintenance.
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Signal Analysis
Synchronous Accumulation (Order Analysis)
Order analysis is one of the most convenient and efficient methods for diagnostics and balancing of rotating mechanisms and transmission gears. With an RPM sensor and a vibration sensor, it is possible to study the time characteristics of gear vibration signals. It is a well-known fact that a signal from a vibration sensor is affected by signals from other sources. To tune out from the disturbing signals, the synchronous signal accumulation method is used. For each shaft rotation, the RPM sensor provides a rotation mark. This signal serves as a triggering strobe for the vibration sensor signal sweeping. The obtained signal sweeps are combined. All the sources of the signals related to the shaft frequency (frequency of rotation) are accumulated and increased in the accumulator linearly proportionally to the N number of rotations. All other signals that are not correlated with the shaft frequency are accumulated proportionally to N1/2 and in case of a greater number of averagings, the useful signal exceeds the interference level.
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A Visual And Interactive Tool For Pre-CTS Analysis And Post-CTS Verification
ConTree
ConTree is a clocking logic visualization, analysis and verification tool. It is used for both pre-CTS clocking analysis as well as post-CTS clock tree verification.
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Time Domain Analysis
S96010B
The S96010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on the E5080B.
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Static Weathering Testing
Atlas Material Testing Solutions
Atlas' outdoor exposure sites provide a wide range static exposure testing for a variety of materials and end use conditions. Static (real-time) weathering testing capabilities include direct exposure using fixed or variable angle, backed or unbacked racks; indirect (under glass) exposure for interior materials; and black box exposure for paints and coating materials. Contact one of our qualified representatives to see which tests are right for you.
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Real-time 1/1, 1/3 Octave Analysis Software
DS-0323
This software analyzes the 1/1 and 1/3 octave bands for 2 - 32 channels (2 - 64 channels when two units are connected ) in real-time from 0.5 to 20 kHz. The filter is compatible with the IEC, JIS, and ANSI standards. The equivalent continuous A-weighted sound pressure level (Laeq) and the single-shot sound exposure level (Lae) are calculated simultaneously by setting measurement time. Variations in level (time series) for each band can be saved for up to 2,000 points.
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Signal Analysis
STA/LTA Detector
The STA/LTA Detector program is a representation of a detector of various events in triaxial or single-component time signals. The software is based on one of the STA/LTA detector types.
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Current Signature Analysis
The Iris Power MDSP3 uses the Current Signature Analysis technology which relies on the concept that faults in the induction motor rotor or driven components result in changes to the rotor magnetic field pattern. Unique magnetic rotating fields are produced due to the faults which induce detectable stator current components indicative of the fault.
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Enhanced Analysis Module
DR YIELD software & solutions GmbH
The YieldWatchDog Enhanced Analysis Module (EAM) provides additional options for data visualization and correlation analyses. It transforms your YieldWatchDog client into a fully-functional Yield Management System (YMS).
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Offline Viewing and Analysis: Data Import Tool
B4610A
The B4610A data import tool allows you to import external data into the logic analyzer application for analysis just like data acquired by logic analyzer acquisition hardware. The application runs on a logic analyzer or an external PC. Virtual import modules read data from a module CSV or module binary (ALB) file and make it available to a wide variety of display windows and analysis tools. Module CSV files can be created by external tools or saved from any logic analyzer module. Module binary (ALB) files are created by Keysight InfiniiVision 7000 Series, 6000 Series, or 5000 Series oscilloscopes. Data import modules are a licensed feature. You can evaluate the data import capability on up to 16 rows (states) of imported data without a license.
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Visual Analysis Tool for GNSS Receiver Data
Panorama
Panorama is the flagship tool when it comes to analyzing receiver data. When engineers use Panorama they spend more time looking at plots and making decisions, instead of making plots and writing reports. Panorama takes receiver data (.csv files) from PANACEA and RxStudio (other ODS products) and turns it into over 60 engineering plots ready to view at the click of your mouse. These plots give engineers and analysts the ability to view summary level data, head to head comparisons, receiver specific results, and 3D LLA replays using STK.
