ICT
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: ICT Systems, In-Circuit Test
-
Product
In-circuit Test
i3070
-
The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
-
Product
Interface Probes
-
Low resistance used in: *ICT Testers *Functional Testers *Special Purpose Machines
-
Product
High Temperature Chip Resistors
ERJ-Hxx Series
-
Panasonic Industrial Devices Sales Company of America
Panasonic’s ERJ-Hxx Series Automotive Grade Thick Film Chip Resistors feature a maximum Category Temperature of 175°C and a maximum Rated Operating Temperature of 105°C. The ERJ-Hxx Series is AEC-Q200 compliant, ensuring strict quality control standards are in place to enforce optimal quality and reliability. The ERJ-Hxx Series Resistors offer a small size, higher power Resistor alternative that provides enhanced flexibility of PCB design by reducing solder-joint crack risk. This series is ideal for use in automotive, ICT, general industrial applications, and more.
-
Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
-
Product
In-Line Full Automatic Testing System
ALMAX
-
Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
-
Product
In-Circuit Tester Integration
-
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
-
Product
Boundary Scan Program Development Service
-
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
-
Product
Modular Relay Board
-
Alliance Support Partners, Inc.
An increasing number of electronics products are being assembled in panels of 8 or more to minimize production cost. These products are typically tested with in-circuit tests (ICT) followed by power-on functional tests. Normally, ICT requires isolation of power and ground while measurements are being performed. Functional tests, including in-system programming (ISP), require board power to be applied. The Modular Relay Board (MRB) is designed to switch power onto each individual board and to disconnect sensitive signals during functional test.
-
Product
Modular Test System
DMT
-
The DMT Tester is a modular test system that allows rapid measurement of electrical and non-electrical parameters of functional units. The system also allows basic ICT measurement with optional accessories. It is conceived as modular, with the possibility of integrating a wide range of own and external instruments. The DMT tester is controlled by its own SCADUS software.
-
Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
-
Product
PCB Test Fixtures
-
ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.
-
Product
In‐Circuit Test Fixtures
-
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
-
Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
-
Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1-228X-S (Small IF) / 230514
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
Controller
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
-
Product
Line Automation Equipment
5000 Series In-line Handler
-
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
-
Product
ABex Matrix Module with 86x4 or 43x8 Cross Points
ABex TM-404 Matrix
Matrix Switch Module
The ABex TM-404 is a 86×4 matrix designed as a universal connection between the test points and the measuring instrument. This can be done locally or via the ABex. The ABex TM-404 can be configured as a matrix with 4 or 8 busses. The internal matrix busses can be switched to the analog bus. The back connector allows to connect the TM-404 to the front of a Konrad PXI-501 ICT card to build a very compact ICT instrument. In addition, this combination can be used as an ABex system controller
-
Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
-
Product
ICT Programmer
-
Compatible with a wide range of microcontrollers in electronic devices. Supports programming of single product or bulk PCBA boards. Enables quick replacement of the adapter or dedicated product inserts. Equipped with a high-performance, multi-channel industrial ISP programmer.
-
Product
XJLink2-3030
-
The XJLink2-3030 provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from SPEA 3030 ICT machines.
-
Product
Spring Contact Probe
ICT
-
LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
-
Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
-
Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25L-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1L-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72U-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
-
Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1I-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1L24-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1T-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02





























