Probing Micropositioners
set a probe in x-y dimension handsfree.
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Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-8
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1UN-8-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Energy Probes
RjP-400 Series
The RkP-400 Series probes consist of a compact detector assembly, or head, and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1" (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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Microwave Probes
S-Probe
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1P-8-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1V2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Differential Active Probe, 1 GHz
DP0012A
The Keysight DP0012A is the 1 GHz model of the DP001xA Series differential active probes. These probes provide the superior general-purpose differential signal measurements required for many of today’s high-speed power-related measurements such as motor drives, automotive differential bus measurements, and high-speed digital system designs.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T30-7-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1HF-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1B-6-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72I15-6
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Standard 0.50 (14.00) - 2.00 (57.00) Non Replaceable General Purpose Probe
A-A-S-R
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 310Overall Length (mm): 7.87Rec. Mounting Hole Size (mil): 31.5Rec. Mounting Hole Size (mm): 0.80Recommended Drill Size: #68 or 0.79 mm
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Probes
Fujian Lilliput Optoelectronics Technology Co., Ltd.
We are one of the leading and professional probes manufacturers and suppliers in China. Thanks to our highly qualified experts and advanced technology, we are also one of the world's leading brands. Welcome to buy the quality, cheap and durable probes in stock from us. Check the quotation with us now.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-4
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Alternate 2.14 (61.00) - 6.00 (170.00) Bead Probe
BTP-72HF-6
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Probes
71 Series
American Probe & Technologies, Inc.
10 mil (0.010") shank sizesAvailable in straight and bent shapes
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T24-7-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Probe Cards
Minitile™ with Advanced Cantilever™ technology and WedgeTile™
Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
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Alternate 0.99 (28.00) - 6.00 (170.00) Long Travel Bead Probe
BPLT-25F-6
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Turbidity Probe
AS16-N
High precision probe for direct installation into pipelines and vessels measuring NIR light absorption (turbidity) of various liquid samples. The optical path length can be individually configured to meet the process control requirements with the highest accuracy.
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Differential Probe
DP-16VF
*MAX. Input Voltage: ±8KV DC or 16KV p-p or AC 5.6KV rms*Bandwidth: DC-150MHz*Input Impedance 20MΩ // 5PF*X400, X4000 Attenuator*To Ground MAX. Voltage: 3.5KV CAT III*Output Impedance 50Ω
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Semiconductor Probe
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Power Probes
RkP-500 Series
The RkP-500 Series probes take advantage of synchronous detection (chopper/lock-in amplifier) technology to offer unparalleled background noise rejection, S/N ratio, and sensitivity. Total power, average power, and irradiance can be measured. The probes can be mounted directly onto the Rk-570C Optical Chopper to form an integrated measurement system, or the chopper can be operated remotely from the probe.
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Power Probes
RkP-400 Series
The RkP-400 Series probes consist of a compact head containing the detector and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1” (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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Hall probes
Axial, transverse, multi-axis, and tangential Hall probes for measuring magnetic flux density. Choose from a wide range of lengths and thicknesses—probes are also available for cryogenic applications.
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LFRE-1 High Performance Lead Free Probe
LFRE-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
