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Process RF Analyzer
IMPS-4400
The Sensortech Instant Moisture Profiling System (IMPS-4400) is a non-contact RF moisture profiling system for board manufacturers to improve and optimize production processes and meet quality standards, reduce energy costs, increase productivity, and generate revenue. The IMPS-4400 utilizes radio frequency antennas to analyze board moisture characteristics below the surface, which is critical information to ensure consistent quality of finished boards.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Ocean Observer III
Teledyne Marine RD Instruments
Since 1997 Teledyne RD Instruments has been providing ADCPs that have proven in the field they can profile beyond 1000 m from research vessels traveling at speeds >15 knots and from offshore oil and gas platforms during exploration work. That same technology has now allowed us to create the Ocean Observer III 38 kHz ADCP. We have combined our field-proven 38 kHz phased array ADCP transducer with our field-proven electronics into a single package that is capable of profiling >1000m. This design makes it ideal to be mounted from an oil platform, over the side of a vessel, and in surface buoys.
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Beam Profiling
The beam propagation factor M2 is a common single parameter that charac-terizes the whole beam as it propagates through space. According to ISO standard 11146, this parameter could be defined by several measurement techniques based on beam profiling along several points of the propagating beam. The standard defines several measurement techniques, all of which are based on beam profiling measurements using devices such as cam-eras, knife edge and slits. There are two main measurement requierments - 1) Measurements of focused beams. 2) Measurements of collimated beams. Our M2 devices are capable of measurements of both laser types and due to their modular design interchangeable heads can be mounted in same M2 gear.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
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Thermal Profiling System
lt is impossible to have dependable production without quality management. The expectation is growing and customers requirements must be addressed. In most of the industries, proper monitoring of temperature with time plays an important role in the quality of products. Whether it can be painted/powder coating industries, oven manufactures, automobile industries, and many more.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Beam Profiling System
BeamCheck
BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Surface Thermography
Advanced Thermal Solutions, Inc.
Liquid Crystal & Surface Thermography Systems for Temperature Mapping Studies.
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Surface Analysis
Dimension FastScan Bio
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Ocean Surface Monitor
Current Monitor™
sigma S6 Current Monitor™ is a radar-based monitoring system that delivers ocean surface current data from moving stations and both current and bathymetry from fixed locations with high spatial resolution. This greatly improves the management of marine-based activities such as predicting oil slick drift patterns, enhancing navigational safety, and protecting vulnerable coastlines.
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Profiling Systems
ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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Surface Profile Gauge
SRT-6223
Specially used to take accurate measurement of the peak to valley height of the surface profile of the surface profile of blast cleaned surfaces.specifications:display: 4 digits. LCDRange: 0um to 800um (0mils to 30mils)Accuracy: +5% or +5( whichever is the greater)resolution: 1um (0.1mils)Metric and Imperial switchablePC interface: RS232CMeasurement speed: >30readings per minuteweight: 280gdimensions: 162x65x28mm(6.4x2.6x1.1 inch)operating temperature: 0-50℃ , 80% RHCase: high impact ABSBatteries: 4x1.5v (AAA) Batterystandard accessories included:carrying case: 1 pcoperation manual 1 pcoptional accessory:cable and software for RS232C
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Surface Roughness Meter
Shenzhen Graigar Technology Co.,Ltd.
Surface Roughness Tester is powerful, accurate and easy to use. It is ideal for checking large components, structures, auditing batch prior to shipment and production line process control.
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Skin Surface Probe
SST-2
The SST-2 skin surface temperature probe for humans, with convenient plastic handle. Probe re-useable and has a fast response time.
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Surface Area and Porosity Analyzer
ASAP 2460
The ASAP 2460 Surface Area and Porosity Analyzer incorporates a unique expandable system designed for high-performance and high sample throughput. The base ASAP 2460 is a two-port master control unit. For more throughput, additional two-port units can be connected to the master unit expanding the system to either a four-port or six-port analyzer. The instrument also includes intuitive MicroActive software that combines user-defined reports with the ability to interactively evaluate isotherm
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Entry Level Beam Profiling
BeamMic®
BeamMic is simplified set of measurement tools for the entry level beam analysis user. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. BeamMic includes a complete set of high-accuracy measurements, and features a rich graphical interface. For the laser technician, this entry-level software will easily help you quickly become familiar with the many benefits of beam profiling.
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Multibeam Profiling Software
MB-DataLogger
Teledyne BlueView's MB-DataLogger software provides a powerful tool for multibeam profiling applications. From mission setup to data playback, review, and export, MB-DataLogger gives users full end-to-end mission support. Set up data collection parameters (sonar head range, ping rate, filename identifiers, etc.) for a SmartCore-enabled system prior to deployment, then review bathymetric profiles in a 2D or 3D waterfall display with or without navigation correction post mission. When regions of interest are identified, export batches of data files to georeferenced point clouds to be imported by third-party applications. MB-DataLogger is the software Swiss army knife for your BlueView multibeam profiling system.
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Surface Resistance Meter
SRMETER2
The Surface Resistance Meter is a wide range, multi-scale, auto-ranging meter. This meter is appropriate for auditing static control work surfaces.The meter is 9V battery powered and simple to use.NIST Calibrated
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Surface Profile Gages
PosiTector® SPG
Surface Profile Gages for Blasted Steel, Textured Coatings and Concrete Profile. Digital depth micrometer measures and records peak to valley surface profile heights.
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Surface Area and Porosity Analyzer
TriStar II Plus
Micromeritics' TriStar II Plus is a state-of-the-art instrument suited for use in both quality control and research environments. Intended for laboratories that require high throughput and the highest quality data, it contains all the capabilities of the TriStar II with additional hardware and software features.
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Digital Surface Profile Gauge
NOVOTEST SP-1M
Digital Surface Profile Gauge NOVOTEST SP-1M is designed for profile measuring on either flat or curved surfaces. Also it can be used for measurements of surface roughness (Rz), after abrasive blasting pre-painting work.
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Extended SWIR Camera For Laser Beam Profiling
BPCam
Princeton Infrared Technologies, Inc.
The Princeton Infrared Technologies’ extended SWIR response T2SL BPCam SWIR camera for laser beam profiling supports extended SWIR wavelength response with TEC cooled operation.
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Surface Mount Temperature Sensor
SCS
The Series SCS Low Cost Current Switches are ideal for monitoring whether fans, pumps, or motors are operating. The current flowing through the core of the device powers the circuit without an external power supply. All models have a built in solid state output and are easy to install. Optional LED's and 10 Amp relay modules are available. The Series SCS is available in both Split and Solid Core configurations
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CTDs: Profiling
Profiling CTDs make continuous measurements as they travel through water. When lowered over the side of a ship or integrated with an autonomous vehicle, they map a vertical column of water's characteristics. Compared to moored CTDs, profiling CTDs account for dynamic errors introduced by moving through water and sample rapidly to generate a high-resolution dataset over a short period of time. Sea-Bird Scientific profiling CTDs are:*Designed to perform under unique dynamic conditions found on moving platforms.*Pumped and ducted for constant flow to match temperature and conductivity response.*Plumbed so measurements are made on the same sample of water with a predictable delay and predictable flow effects.*Built with a rugged design for shipboard and autonomous deployments.
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Surface Potential Measuring Instrument
In the electronic equipment assembly process, there are many items that are charged on the order of kV, such as resin molded products and films. This digital electrostatic potential measuring instrument is suitable for processes with relatively high electrostatic control voltage.The measurement range switching function makes it possible to measure from low potential measurement of electronic devices to high potential measurement of resin molded products, film / printed circuit board manufacturing, etc.
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RTXCview System Trace and Profiling Tool
RTXCview
RTXCview is a system trace tool designed to work in tight integration with the RTXC Quadros RTOS family. This powerful visualization tool gives you deep visibility into system performance and behavior. Typical embedded system development tools such as debuggers can only provide a static view of your system, focusing on code-level details. RTXCview complements this view by providing a system-level view, showing how tasks and interrupts interact with the RTXC kernel.
