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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Design-for-Test
As designs move to smaller and more complex process technologies, ensuring devices are thoroughly tested becomes a bigger challenge. Mentor Graphics provides whole-chip test solutions that can help improve test -- and, therefore, device -- quality as well as control, or even reduce, the cost of test.
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N Test Finger Nail
TF-24 series
Are designed to perform tests specified in many standards to determine compliance with safety requirements.
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PXI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Hybrid, Multifunction I/O Module
779630-01
32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6229 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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64-Channel Boundary Scan Digital I/O Scan Module
JT 2111/MPV DIOS DIN
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.This JT2111/MPV DIOS module is also available through our webshop.
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PXI Resistor Module 2-Channel 1.5R to 2.04k with SPDT
40-293-122
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Generic Probe Cards, PIB's, and Loadboards
Test Spectrum can provide generic Probe Cards, Probe Interface Boards (PIB), and loadboards. Choose from existing configurations already designed, or a generic test board for your specific tester configuration can be designed quickly.Teradyne J750 Probe Card and PIB; Teradyne Integra Flex PIB; Teradyne Ultra Flex PIB; Teradyne Catalyst PIB; Credence Quartet PIB (Probe Interface Board); Advantest 93K 1024 PIB
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PXI Resistor Module 2-Channel 2R to 131k
40-293-034
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 1.02k Ohm - SPST
40-294-121
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI 16 Trib Daisy Chain Switch 75 Ohm 96 Way
40-793-701
The 40-792/793 Daisy Chain Switching Module is designed for telecom test applications. It allows production or verification testing of SONET/SDH transmission multiplexers switching 2MBit/s or 1.5MBit/s data. Traffic is sequentially Daisy- Chained through all tributaries (or any selection of tributaries), modules can be cascaded to test any number of tributaries.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 255 Ohm - SPST
50-294-113
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Optical Testing
We place a great emphasis on our ability to test everything we produce and supply. This has provided the impetus for us to design and build comprehensive testing facilities that include standard as well as custom-made testing equipment.
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VME Load Card
WIENER VME load boards are designed to test VME crate power supplies and fan trays by drawing power from the VME backplane and dissipating it as heat. A series of switches on the module front panel allows for easy adjustment of the current draw for each voltage channel.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 127 Ohm
50-294-012
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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ACCUplace Position Grid
AP-P Series
The AP-P is a unique calibration target that is designed to test the position and/or recognition ability of a vision system. The matrix of small scales, precisely positioned in a grid matrix format, makes testing for subject recognition and system positioning simple.The overall target is comprised of a matrix consisting of 6.0mm x 6.0mm square individual components each having a 5.0mm x 5.0mm X & Y Scale with 0.100 divisions. The scale has pitch accuracy of 1μm. The AP-P is available on two standard materials; Chrome on Glass (CG) and Chrome on Opal (OP).
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Industrial Battery Tester
The Industrial Battery Tester (IBT) has been designed for testing traction batteries or batteries for stationary applications. It can also be used for testing other types of batteries. The IBT performs charging and discharging in accordance with the programmed test schedule. Parameters are constant current, constant voltage, constant resistance and constant power.
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PXI Resistor Module 2-Channel 1.5R to 4.09k
40-293-023
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Large Format - Step & Repeat Tester
GATS-8300
The GATS-8300 Tester is one in a series of Test Systems designed for testing multiple-image panel using a Step & Repeat process. Rather than fixture the entire panel for electrical test, you simply fixture for one (or more) images. The GATS-8300 will Step the fixture across the entire panel and Repeat the electrical test at each step.
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PXI Resistor Module 4-Channel 1R to 255R
40-293-013
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Air Data Computer (ADC) Tester
MS 1122
The ADC tester is used in 2nd line maintenance is to check the functionality of ADC. This unit is a rugged customized hardware based on full functionality test of ADC. The Air Data Computer (ADC) Tester is a fully automated GO/NOGO tester with full functional testing in 2nd line maintenance. This tester is to test ADC at unit level and identify faulty Shop Replaceable Unit (SRU). This tester is also used to carry out PI checks on ADC before clear them for installation on aircraft. ADC Interface board designed to test full functionality of ADC. The Air Data Computer (ADC) test equipment shall be used for testing ADC of Tejas Aircraft. ADC test equipment shall verify the functionality against specifications during second line maintenance and pre-installation on the aircraft.
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JTAG Visualizer
JTAG Visualizer is an advanced graphical viewer and data management system for PCB schematics and layouts. Visualizer integrates seamlessly with the JTAG Technologies family of boundary-scan products, such as the ProVision application development platform, and accepts PCB data from a variety of CAD, CAM and EDA tools. In design Visualizer provides DfT (design for test) feedback to the user by enabling a graphical view of fault coverage on their design. In manufacture and test Visualizer can be used to highlight faulty nets (short circuits, opens, stuck-ats etc.) in both layout and schematics views.
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PCI Resistor Card 2-Channel 2 Ohm To 65.5k Ohm
50-293-033
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PCI Resistor Card 4-Channel 1 Ohm To 127 Ohm With SPDT
50-293-112
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PCI Programmable Resistor Card 2-Channel 3 Ohm To 65.5k Ohm
50-294-033
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Hose Continuity Tester
OhmGuard
The OhmGuard hose continuity tester is designed to test hoses used on vacuum trucks and tanker trucks prior to the transfer of flammable or combustible products
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Primary Current Injection Testers
Primary Current Injection Tester is designed for testing protective relay and circuit breakers and also testing the turns ratio of current transformers at high variable currents. A test current is injected into the primary side of a system to determine how the system behaves at particular levels of current. This test makes it possible to determine whether the relay will trip and how long the current needs to flow before the trip is initiated.
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Mach Airspeed Test Fixture
TA-6055A
The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
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Military Test Systems
Santa Barbara Infrared is the leading supplier of sophisticated, integrated, multi-function E-O test systems used by the military in laboratory, factory, depot and field test environments. Each of these systems are built to specific requirements and utilize SBIR’s extensive design and test capabilities, core technologies and knowledge of the unique military applications. SBIR specializes in providing complete solutions with integrated hardware and software resulting in robust and easy-to-use systems.
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BenchTop Chambers
Nano Series
The Nano series of bench top chambers are designed for testing relatively smaller sizes of specimen. With a small foot print, this chamber is capable of performing low, high temperature and humidity tests.
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Mil-C-24231 Connector
100 Series
The Teledyne DGO 100 Series connectors are designed, manufactured and tested in accordance with the stringent requirements of Mil-C-24231 and used primarily in Navy dry mate submersible interconnect applications.





























