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High-Speed Precision SMU (100 FA, 60 V, 15 MSa/s)
PZ2121A
The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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Power ICs - Smart Load Switches
Combining multiple functions in a single IC, Vishay smart load switches eliminate the need for external circuitry . A simplified GPIO interface allows for power distribution and sequencing of multiple sub-systems. Slew-rate-control devices provide a controlled supply ramp to reduce inrush current, while fault protection and isolation switches increase robustness with reverse current, overtemperature, current limiting, and short circuit protection features. The ICs offer quick output discharge and small footprints, while their integrated design saves PCB space compared to discrete solutions, reduces BOM counts, and lowers manufacturing costs.
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MMIC (Monolithic Microwave Integrated Circuit) Millimeter-Wave & Microwave Devices
Keysight offers a series of millimeter-wave and microwave MMICs that provide superior performance over a wide bandwidth from DC to 50 GHz, including both analog and digital applications. The below listed HMMC and HSCH products are available through a selection of worldwide distribution partners. The 1Gxx line of products are also available through distribution partners to a select set of customers. Certain restrictions apply.
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High Impedance Active Probes
28 AND 29
Designed to serve the needs of integrated circuit engineers working in the most advanced high speed, submicron, MOS technology. These high frequency instruments include the attractive features of the Models 18C and 19 including full dc capability, negligible dc current drain, and extremely low input capacitance. In addition the frequency range of the Models 28 and 29 has been extended to a full 1 GHz.
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Switches-SP5T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Reliability Testing
ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Copper Diffusion TestSystems
Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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Copper Pillar Bump
Like in conventional fabrication, integrated circuits are created on the wafer but near the end of the manufacturing process, the attachment pads are metalized on the surface of the chips to make them more receptive to solder. Then solder dots are deposited on each of the pads, and chips are cut, flipped, and positioned so that the solder balls are facing the connectors on the external circuitry.
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Analog Power Supply
Type NPS-2412
National RF's Type NPS-2412 analog power supply was designed to be used in communication equipment where radiated switching inverter noise from conventional “switching type” supplies is not acceptable. The power supply consists of a standard rectified transformer output driving a pair of voltage regulators and filtering networks. The 2412 offers an adjustable voltage output between 2 and 24 volts as well as a fixed voltage output of 12 volts. A maximum of 20 Watts of DC power can be supplied from the unit. As the voltage regulators dissipate power in the regulation process, the power to the load is derated accordingly, dependent on the set voltage to the load. The adjustable regulator is a standard LM-317T integrated circuit device. The fixed regulator is a standard LM 7812 device. Upon customer request, the LM 7812 device may be changed to any voltage rating within the the LM-78xx series of regulators. Contact National RF for this modification if desired.
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Switches
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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5kV Insulation Resistance Tester
KV3122
KV Hipot Power Test Equipment Co.,Ltd
KV3122 Insulation Resistance Tester is suitable for measuring the resistance of various insulating materials and the insulation resistance of transformers, motors, cables and electrical equipment. Digital insulation resistance meter is composed of medium and large scale integrated circuits, including high-precision micro current measurement system, digital boost system and automatic discharge circuit.
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Power ICs - MicroBUCK® - Voltage Regulator
*Highly integrated microBUCK POL solutions deliver high efficiency while reducing costs*Each family offers a large portfolio of high density parts with common pinouts, allowing designers to scale for the best combination of cost and performance*Our PowerCAD simulation tool allows users to select the appropriate microBUCK regulator and generate a full circuit schematic**For performance optimization and comparison purposes, the schematic can then be edited as required.**Once the basic circuit is created, the user can perform DC, transient, and start-up simulations with visibility of all the circuit node waveforms.**Following these steps, the PowerCAD 2.0 simulation tool generates a bill of materials (BOM) available for online ordering.
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Embedded Boards
UltraZed Family
Embedded boards are boards with processors, multiple integrated circuits, interfaces and other essential components assembled on it to serve a dedicated function. Embedded boards comprise multiple technologies, including processors, core logic, networking, connectivity, and multimedia components to provide functionality and performance for embedded system design applications. Embedded boards and solutions are normally employed to ensure a faster time to market for the developer. Applications of embedded systems vary from tiny portable devices, to large commercial and industrial installations, and even largely complex systems like medical or military or aviation purposes. Embedded boards can have single MCU chip or multiple MCUs depending on the complexity of application.
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PXIe-4162, 12-Channel, ±24 V, Precision PXI Source Measure Unit
785680-01
PXIe, 12-Channel, ±24 V, Precision PXI Source Measure Unit - The PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. This module features 4-quadrant operation, integrated remote (4 wire) sensing in each channel for accurate measurements, as well as analog-to-digital converter technology to help you perform high-precision measurements. It also features guard terminals to remove the effects of leakage currents and parasitic capacitances. Additionally, the PXIe-4162 can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4162 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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CompuScope GPU CUDA Processing
Performing real-time digital signal processing (DSP) routines such as Fast Fourier Transform (FFT), Signal Averaging, Finite Impulse Response (FIR) Filtering, Digital Down Conversion (DDC) and more have traditionally required the use of dedicated DSP processors, Field Programmable Gate Arrays (FPGAs), or Application Specific Integrated Circuits (ASICs).
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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6.8 GHz Wideband Synthesizer with Integrated VCO
ADF4356
The ADF4356 allows implementation of fractional-N or integer-N phase-locked loop (PLL) frequency synthesizers when used with an external loop filter and an external reference frequency. A series of frequency dividers at another frequency output permits operation from 53.125 MHz to 6800 MHz. The ADF4356 has an integrated VCO with a fundamental output frequency ranging from 3400 MHz to 6800 MHz. In addition, the VCO frequency is connected to divide by 1, 2, 4, 8, 16, 32, or 64 circuits that allow the user to generate RF output frequencies as low as 53.125 MHz. For applications that require isolation, the RF output stage can be muted. The mute function is both pin- and software-controllable.
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High-Speed Precision SMU (100 FA, 60 V, 1 MSa/s)
PZ2120A
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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Plasma CVD & Reactive Ion Etching System
MODEL DRIE-1100-LL-ECR
The Tek-Vac DRIE-1100-LL-ECR series systems are designed for both high-density plasma chemical vapor deposition and reactive ion etching of sub-micron integrated circuits, optical devices and RF microwave electron devices.
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ASICs
ams has been creating unique ASIC (Application Specific Integrated Circuit) solutions in partnership with customers for over 30 years. We enable our partners to create highly differentiated products that are smarter, safer, easier to use and more eco-friendly. Our various industry experts in automotive, industry, medical and smart building are looking forward to talk to you and to define the solution which will exactly fit your needs.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-01
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Switches-SP4T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Optical Component Test
Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Accelerate and improve your design or optimize your production with Luna’s suite of component analyzers and testers.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Electronic Components
We supply a wide range of components and materials to the electronics industry, such as: integrated circuits for personal computers, semiconductor materials for system LSI, optical communication materials for telecommunications, components for display devices seen in smartphones and projectors, and materials used in solar cells and lithium batteries.
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Voltage Breakdown Testing Machine
DRK218
Shandong Drick Instruments Co., Ltd.
DRK218 breakdown voltage tester is controlled by the computer, through a new smart digital integrated circuits developed by my company and software control system to make the step-up rate is truly uniform, accurate, and be able to accurately measure the leakage current data. Real-time rendering test curve accurate judgment and it can save, analyze and print test data.
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Electric Brake Force Meter With Dynamic Load Simulation And Circuit Testing
9107A
Innovative Products of America
The #9107 Electric Brake Force Meter with Dynamic Load Simulation and Circuit Testing (patents pending) is designed for use on 7-spade equipped vehicles. This new technology automatically recognizes the electronic signature of both Integrated (ITBC) and aftermarket Trailer Brake Controllers, simulates trailer load and displays real-time, brake-controller output gain and application time. It can quickly troubleshoot truck-side tow circuits, e.g., tail lights, turn signals, 12V+, reverse and ground condition and the 25 ft. cable allows for one-man, in-cab testing.
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Thermal Cycling Test Equipment
Wewon Environmental Chambers Co, Ltd.
IC welding to PCB, IC is integrated in the chip general purpose circuit, it is a whole. Once the inside is damaged, the chip will be damaged. The goal of printed circuit boards (pcbs) is to connect IC and discrete components to form a larger working circuit. Thermal cycling equipment can detect the defects and hidden dangers of welding components in the production process, decreasing failure rate. When it fails, components can be replaced in timehttps://www.wewontech.com/thermal-cycling-test-equipment/
