Diamond
an allotropic form of carbon.
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Product
Operating System Support Software
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Diamond Systems offers software support for our embedded computer boards, ranging from drivers to complete OS board support packages. The currently available driver and BSP support can be found by clicking on the links below. If what you need is not listed, please contact us to discuss custom software support options.
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Product
SFP Module
F-3000
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The DIAMOND flexos SFP modules (transceivers) make it possible to transfer data via fibre optics. The SFP modules are available for multi-mode and single-mode, Gigabit and Fast Ethernet. The SFPs have metal housings with latches for the simple removal of the module. They are compatible with connector types F-3000™ or LC.
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Product
Hardness Testers
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The hardness tester products you will find at PCE Instruments (PCE) are used for determining surface hardness. Each hardness tester uses a standard method of measurement. The measuring principles of most hardness tester devices are based on either the penetration of a diamond indentor into the material being tested or a calculation related to the force of the rebound after striking the tested material. However, material hardness can also be measured accurately through ultrasonic testing. Each hardness testing method has its benefits and will allow for the precise measurement of material hardness in accordance with the technical specifications of the hardness testing instrument.
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Product
Diamond Authenticity Testing
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The International Institute of Diamond Grading & Research
These services fully test all goods to verify diamonds, identify synthetics and simulants, and then return them in tamper evident sealed parcels with clear labelling as to the nature of their contents.Our laboratories are in three global locations: Antwerp, Surat, and Maidenhead. At all our facilities, our experts use comprehensive analysis using a variety of different in-house and proprietary equipment to ensure that every diamond we assess is natural.
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Product
Diamond-like Carbon (DLC) Foils
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An intense laser beam is used to evaporate carbon from a graphitic sputter target. In the process, the graphite structure of the source material is converted into nano-particles, which deposit on prepared substrates as diamond-like carbon. The properties of these unique carbon foils make them useful in a variety of applications, in particular beam stripping, as backings for accelerator targets or x-ray attenuators.
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Product
Semiconductor Test Platform
Diamondx DxV
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The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:
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Product
FPGA Design, Meet Easy.
Lattice Diamond Software
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Easy Design Exploration – Finding the best solutions often requires evaluating multiple solutions. Lattice Diamond allows for easy design exploration.
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Product
Air-Cooled Universal Test Platform
Diamondx
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Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Product
Non-Destructive Testing (NDT)
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Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Product
Bi-directional SFP Modules
BiDi SPF
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The DIAMOND SA flexos BiDi-SFP modules (transceivers) make it possible to transfer data via fibre optics. The Bi-Di SFP modules are available in single-mode and Gigabit Ethernet. The SFPs have metal housings with latches for the simple removal of the module. They are compatible with connector types F-3000™ and LC.
