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Failure Analysis
examination of faults, determine root cause and recommend corrective actions.
See Also: Crush, Performance Testing, Investigation
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Structural & Stress Analysis
Structural analysis is critical because it can determine cause and predict failure – evaluating whether or not a specific structural design will be able to withstand the external and internal stresses and forces expected for the design.
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Thermal Image Analysis Software
Thermalyze
Thermalyze software provides a stable platform from which to perform sophisticated temperature analysis and failure analysis testing. Tools such as Emissivity Tables allow you to perform true temperature mapping on the surface with varying emissivity. Lock-in thermography tests enable you to detect heating below 0.001°C.
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Leeb Hardness Testers
Your product description goes here. Leeb hardness tester application: Leeb hardness tester is for metal. Die cavity of molds,Inspection of bearing and other mass produced parts on a production line,Failure analysis of pressure vessel, steam generator and other equipment, Inspection of installed machinery, permanent parts of assembled systems and heavy work pieces.Rapid testing in large range and multi-measuring areas for large-scale work piece.
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FTIR Spectrometers
FTIR spectroscopy is used to quickly and definitively identify compounds such as compounded plastics, blends, fillers, paints, rubbers, coatings, resins, and adhesives. It can be applied across all phases of the product lifecycle including design, manufacture, and failure analysis.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
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Test System
ETS788XL
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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Automated DC Parametric Curve Tracer
MultiTrace
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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Power System Recorder with CDR , PMU and IEC 61850 station bus protocol
TESLA 4000
ERLPhase Power Technologies Ltd
The new TESLA 4000 is an intelligent, state of the art, user-friendly multi-timeframe dynamic power system recorder with advanced Phasor Measurement Unit (PMU) and Continuous Disturbance Recording (CDR) capabilities. Wide area swing recording accomodates system performance analysis in minutes Meets NERC continuous disturbance recording standards with non-volatile on board flash memory No mechanical moving parts – flash drive eliminates most common mode of failure in recorders. Each flash drive holds 1000 records. IEEE C37.118-2005 SynchroPhasor Standard
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Benchmark, Competitive and Failure Analysis
Helping you determine the root cause of product failures and evaluate products against industry competition and standards.We provide third-party verification and support for claims related to performance versus competition, root product failure cause, and benchmark industry performance. As an independent laboratory with over 60 years of product testing experience, our expertise helps you evaluate products for a variety of performance related characteristics. Additionally, we can provide expert witness legal testimony for insurance claims, CPSC filings, and civil/criminal court cases through our testing results and data.
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Bench & Characterization Boards
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Data Reduction
Data reduction systems with or without time history recording to throughput disc are frequently used in critical aerospace testing applications where complete measurements of a high number of channels are required for post-test and possible failure analysis. The m+p VibControl data reduction system configurations are tailored to the specific needs of high-performance measurement applications requiring hundreds or thousands of input channels.
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Component Test and Analysis Laboratories
The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Torsional Vibration Analysis System
Torsional vibration analysis is the analysis of the torsional dynamic behavior of a rotating shaft system as a result of forced vibration. Excessive torsional vibration leads to very expensive failures such as damaged shafting, couplings, gears, auxiliary equipment, and more. Repair costs to such equipment can be very expensive. Preventing torsional failures requires adequate analysis over the equipment’s intended range of operating conditions. Jumho Electric torsional vibration analysis system acquires rotary speed signals, calculate the angular velocity fluctuation rate, and therefore obtain various waveforms, angular velocity and acceleration.
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Damage Indication
FilterCHECK
Get the full picture immediately with FilterCHECK: accurate on-site damage indication — wherever you do maintenance.Equipment fluid filters have a story to tell. With FilterCHECK, filters reveal an accurate account of component wear and damage, plus a reliable prediction of the time remaining to component failure. Easy to use, field-deployable FilterCHECK automates filter debris analysis, so your team can manage maintenance decisions efficiently. Avoiding component failure, reducing maintenance costs and eliminating service interruptions: three reasons FilterCHECK belongs on the shop floor, wherever mission-critical equipment is serviced and maintained.
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Battery Test Equipment
Improper functioning of battery systems installed in utilities, power plants, telecommunication systems, industrial applications and etc., can cause severe failures of the supported equipment and loss of critical information. Therefore, the battery test verifies their actual SOC (State of Charge) or SOH (State of Health) and prevents unwanted scenarios which could result in a significant budget loss as well as endanger of human lives.DV Power battery test equipment is able to perform the following battery measurements, using BLU and BVR devices:- Voltage (String and Cell)- Capacity- Temperature- Density of electrolyteAll of the above-mentioned measurements are performed with the highest accuracy. The advanced DV-B Win PC software enables collecting both numerical and graphical results. These features provide an easier and more efficient analysis. After the test, DV Win software generates a test report with a single click. A user can easily customize the report and save it in different formats, such as CLS, PDF, Word, or RTF.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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FEA Software
Helius PFA
Helius PFA software provides powerful tools for enhanced FEA (finite element analysis) of composite structures, including progressive failure analysis.
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Motatest Dynamic
Get Immediate Indication of Your Motors’ Health Do you know which of Your Process Motors are Likely to Fail? It is a Question of Efficiency and Potential Failure For online monitoring and measuring of electric motors whilst running. Measuring the motors performance with special analysis software to give a complete picture of the motor, its supply and its load.
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ISDD Tool Suite
eXpress provides an environment for the design, input, integration, assessment and optimisation of system diagnostics as well as Prognostic Health Management (PHM), system testability studies, failure modes and effects analysis and analysis of system dependability.
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Failure and Technology Analysis
Failure analyses in order to clarify the failure cause soonest possible.From single device to the whole system - and from highly complex IC up to printed circuit board (PCB), mounting & interconnection technology and printed board assembly (PBA).
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Microelectronics Test & Engineering Services
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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Shake Table Testing
Response Dynamics Vibration Engineering, Inc.
Shake table testing is often used in prototype analysis, failure analysis, shipping vibration testing and vibration sensitivity testing. We know what boundary conditions are vital for effective testing, how and where to instrument the system, how to deal with for off axis excitation (often not accounted for), and make the most efficient use of testing time. Let us have a look at your system and any specified vibration criteria before the shake test is designed. We can interpret the criteria, make sure it is applied appropriately, and make recommendations that will save valuable time and expense.
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IC Product Testing & Analysis Services
Integrated Service Technology
Integrated Service Technology Inc.
iST (Integrated Service Technology Inc.) is a leading lab-service company, specializing in the development of IC product testing & analysis, failure analysis, debugging, reliability test, material analysis. Apart from developing testing technologies for the upstream IC design and semiconductor industries, iST also expanded to provide a full-spectrum of services for the mid and downstream companies in the electronics industry.
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Integrated/Separated Explosion-Proof Ultrasonic Level Gauge
HR9100E
HighReach Measuring & Controlling System Co.,Ltd
1. Safety / use of die-cast aluminum alloy waterproof, explosion-proof shell; the explosion-proof grade of the instrument reaches Exd (ia) IIBT4 2. stable and reliable / we choose high-quality module key components from the power supply Part of The Circuit Design Stable and Reliable Devices CAN Completely Replace imported Instruments. 3. Patented Technology / Ultrasonic Intelligent Software CAN with Carry OUT Intelligent echo Analysis, the without the any the debugging and OTHER Special Steps, the this Technology has The function of Dynamic Thinking, Dynamic Analysis 4. High precision / sound wave intelligent patent technology owned by our company, so that The accuracy of the ultrasonic level gauge is greatly improved, the liquid level accuracy reaches 0.3%, it can resist various interference waves, the failure rate is low, the installation is easy, and the maintenance is easy. The instrument is a non-contact instrument and does not directly contact with liquid. Users can use this manual to calibrate the instrument. 6. The protection level of multiple protection/instrument reaches IP65; all output and input lines have lightning protection and short circuit protection.
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Surface Insulation Resistance Testing
AutoSIR2™
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Failure Analysis
MicroINSPECT 300FA
The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Electrical Property Measurement
Materials Analysis Technology Inc.
This technology is used to identify the electrical characteristics, such as resistance, capacitance and inductance, of semiconductor devices. Characteristics measured from fail and normal chips could provide important clues for further failure analysis.
