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Failure Analysis
examination of faults, determine root cause and recommend corrective actions.
See Also: Crush, Performance Testing, Investigation
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Failure Analysis – Materials
Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Oil Analyzers
We provide lab instruments, on-site oil analysis systems, and portable tools for a variety of customer needs . Our analyzers provide critical data about machinery condition and can provide an early warning of equipment failure.
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Split Type Ultrasonic Level Gauge
HR9100D
HighReach Measuring & Controlling System Co.,Ltd
1. Stable and reliable / We select high-quality modules and key components from the power supply part to select high-stability and reliable devices, which can directly initiate imported instruments. 2, patented technology / one ring patented sound wave intelligent technology software can Intelligent outgoing analysis without any debugging and other special steps, this technology has the function of dynamic thinking, dynamic analysis 3, high precision / sound wave intelligence owned by our company The patented technology greatly improves the accuracy of the ultrasonic level gauge, the Liquid level accuracy reaches ±0.2%, can resist various interference wavesThe instrument is a non-contact instrument, not Direct contact with liquid, so the failure rate is low. The instrument provides a variety of installation methods, users can use this . The Instrument Manual Calibrate to 5. The Protection of The Level of Multiple Protection / IP67 & Instrument Reaches; INPUT and Output Lines All have have Lightning Protection and Short Circuit Protection.
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Analytical Probe Station with Laser Cutting System
LCS- 4000 Series
The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.
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Microscopy Software Suite/IC Diagnostics
Crystal Vision
Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity.
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Electronics Failure Analysis System
Sentris
Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Bench & Characterization Boards
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Failure Analysis
Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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High Impedance Probes
Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
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Integrated/Separated Explosion-Proof Ultrasonic Level Gauge
HR9100E
HighReach Measuring & Controlling System Co.,Ltd
1. Safety / use of die-cast aluminum alloy waterproof, explosion-proof shell; the explosion-proof grade of the instrument reaches Exd (ia) IIBT4 2. stable and reliable / we choose high-quality module key components from the power supply Part of The Circuit Design Stable and Reliable Devices CAN Completely Replace imported Instruments. 3. Patented Technology / Ultrasonic Intelligent Software CAN with Carry OUT Intelligent echo Analysis, the without the any the debugging and OTHER Special Steps, the this Technology has The function of Dynamic Thinking, Dynamic Analysis 4. High precision / sound wave intelligent patent technology owned by our company, so that The accuracy of the ultrasonic level gauge is greatly improved, the liquid level accuracy reaches 0.3%, it can resist various interference waves, the failure rate is low, the installation is easy, and the maintenance is easy. The instrument is a non-contact instrument and does not directly contact with liquid. Users can use this manual to calibrate the instrument. 6. The protection level of multiple protection/instrument reaches IP65; all output and input lines have lightning protection and short circuit protection.
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Test System
ETS788
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Shake Table Testing
Response Dynamics Vibration Engineering, Inc.
Shake table testing is often used in prototype analysis, failure analysis, shipping vibration testing and vibration sensitivity testing. We know what boundary conditions are vital for effective testing, how and where to instrument the system, how to deal with for off axis excitation (often not accounted for), and make the most efficient use of testing time. Let us have a look at your system and any specified vibration criteria before the shake test is designed. We can interpret the criteria, make sure it is applied appropriately, and make recommendations that will save valuable time and expense.
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Vibration Measurement Tools
SKF Condition Monitoring Center
Abnormal vibrations are often the first indication of a potential machine failure. Conditions that can cause these vibrations include unbalance, misalignment, looseness of parts, deteriorating rolling element bearing and gear damage. Vibration analysis instruments and systems can help detect many serious problems at an early stage, allowing personnel to undertake remedial work in a timely manner.
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Digital Microscope
VHX-6000 Series
Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
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Condition Monitoring Solutions
VibroLine
The VibroLine devices are stationary analysis modules for continuous condition monitoring on machines and systems. The VibroLine condition monitoring system can be used to monitor vibration acceleration, speed or displacement with freely adjustable frequency filtering for different applications. Permanent vibration monitoring of your machines not only brings competitive advantages through the increased efficiency of your systems, but also protects against unwanted machine failures. With the VibroLine devices, you can monitor not only the sum, order and storage characteristics, but also impact characteristics. This offers you enormous flexibility in terms of monitoring parameters for your condition monitoring.
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ISDD Tool Suite
eXpress provides an environment for the design, input, integration, assessment and optimisation of system diagnostics as well as Prognostic Health Management (PHM), system testability studies, failure modes and effects analysis and analysis of system dependability.
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Damage Indication
FilterCHECK
Get the full picture immediately with FilterCHECK: accurate on-site damage indication — wherever you do maintenance.Equipment fluid filters have a story to tell. With FilterCHECK, filters reveal an accurate account of component wear and damage, plus a reliable prediction of the time remaining to component failure. Easy to use, field-deployable FilterCHECK automates filter debris analysis, so your team can manage maintenance decisions efficiently. Avoiding component failure, reducing maintenance costs and eliminating service interruptions: three reasons FilterCHECK belongs on the shop floor, wherever mission-critical equipment is serviced and maintained.
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SilverCreek SNMP Tests
Set up in less than five minutes - Windows or LinuxCustomize tests via Wizards, Script Generators, and moreAutomate operation with unambiguous test resultsIntegrate with other test harnesses and test toolsIncludes conformance, compliance, vulnerability, robustness, stress, and performance testingInvestigate failures and quickly resolve them with powerful diagnostic and analysis tools
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Predictive Vibration Monitor Solutions
VMU
Vibration Monitor Units (VMUs) from Astronics employ proven vibration analysis to predict the failure of fans and other rotating equipment on passenger and cargo aircraft. Accurate prediction allows maintenance to intervene before a failure can occur, eliminating the resulting smoke or smoke smell event that can result in costly flight delays, diversions, emergency landings, or cancellations.
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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. (auto measurement)Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
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System Modeling for Diagnostic Design and Analysis
EXpress
eXpress is a comprehensive model-based diagnostics engineering software application providing an environment for the design, capture, integration, evaluation and optimization of complex or large-scale system diagnostics, prognostics health management (PHM), systems testability engineering, failure mode and effects analysis and system safety analysis. eXpress is uniquely suited to influence the diagnostic development for new designs or to exploit the diagnostic challenges of existing legacy systems. Its robust structure facilitates the capture of extensive interdisciplinary design knowledge providing an unmatched ability to corroborate, reuse and re-purpose expert knowledge in performing standardised testability, reliability and maintainability analyses.
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Leeb Hardness Tester
HT6561
Product synopsis1.1 Typical Applications* Die cavity of molds* Inspection of bearing and other mass produced parts on aproduction line* Failure analysis of pressure vessel, steam generator andother equipment* Inspection of installed machinery, permanent parts ofassembled systems and heavy work pieces.* Testing surface of a small hollow space* Material identification in the warehouse of metallic materials* Rapid testing in large range and multi-measuring areas forlarge-scale work piece1.2 Testing Features* Palm size for narrow space.* Test at any angle, even upside down.* Direct display of hardness scales HRB, HRC, HV, HB, HS,HL.* Large memory could store 250 groups including singlemeasured value, impact direction, material and hardnessscale etc.* User recalibration function allowed.* Can communicate with PC computer for statistics andprinting by the optional cable.* Manual or automatic shut down.* Low battery indication.1.3 Technical SpecificationsDisplay: 12.5mm LCD with back lightAccuracy: Display error ±0.8% at LD=900Measuring range: 200-900LConversion: HL-HRC-HRB-HB-HV-HSDMaterials: 9 different common materialsWith RS232C interfaceMemory: 250 data can be stored and re-readableImpact device: D Will handle the majority of hardness testingapplications. Weight: 75gPower supply: 2x1.5V AAA size batteryDimension: 146×65×36mmWeight: 130g (not including batteries)Working temperature: - 10℃~+50℃Storage temperature:- 30℃~+
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Resistive AC Load Bank
AC load bank testing offers you whole solutions of predictive failure analysis for UPS(uninterrupted power supply), generator, transformers, PV system, inverter etc, to validate the condition and output of such power systems comprehensively. Integrated AC & DC load bank could be made in one unit or separately with different load voltages as per your need for different applications.
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Failure Analysis And Magnetic Imaging Services
Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Cross-Section Analysis Laboratory
PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Failure Analysis Services
Introducing our Failure Analysis services partner, close neighbour and collaborator NanoScope Services. Working together with NanoScope we offer the following portfolio of advanced FA services.