Switch Test
Make, break, or change the connection of a circuit.
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Product
Magnetic Material Test Fixture
16454A
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The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Product
Switch Modules - 26 Two POle Relays Arranged as Two Separate 8x1 Multiplexers
JX16/L2
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This module has 16 two pole relays arranged as two separate8x1 multiplexers as shown in the figure to the left. The muxes may be operated and wired individually for up to 32 8x1's per chassis, or jumpered together to form 16x1's or jumpered to the backplane to form up to a 256x1 mux or two 128x1 muxes. It is available with Type S, M or LT reed relays.
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Product
4-Module ICT System, I307x Series 6
E9903G
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Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-F180-2
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Hybrid Single Site Test Handler
3110
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Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
SAS Protocol Test System
M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
In-Line Test System
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With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
PXI/PXIe RF Switch, Octal SPDT, Terminated, 8GHz, 50Ω, SMA
40-880B-004
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The 40-880B-004 (PXI) and 42-880B-004 are octal SPDT 50Ω RF switches with 8GHz bandwidth. The 40/42-880B range have automatic termination of unused signals and are available as a dual switch in a 1-slot, a quad switch in 2-slots or hex and octal switches in 3-slots.
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Product
PXIe Optical Test Modules
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Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
Test Handler
M4841
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High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
Threaded Switch Probes
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Product sensing - microswitch in a probe - plastic or metal cup - adjustable height.
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
4x8 2 Wire USB Modular Switch Matrix
U2751A
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The U2751A USB Modular Switch Matrix offers a flexible connection path between the device under test and the test equipment, thus allowing different instruments to be connected to multiple points on the device under test at the same time. This instrument is able to support measurements at a high bandwidth of up to 45MHz. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity
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Product
Die Test Handler
3112
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Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
Low PIM Coaxial Switch, DC to 26.5 GHz, SP6T
87106R
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Low passive intermodulation (PIM) is crucial for applications where two or more transmitted signals share a common antenna or whenever the transmitter signal is too high or the receiver is sensitive to high intermodulation. The Keysight 87106R is a low PIM SP6T coaxial switch, operating from DC to 26.5 GHz, which can help to keep the system PIM level low. A guaranteed 0.03 dB insertion loss repeatability and 3 million cycles of operating life ensures signal integrity, improves testing efficiency, and ultimately maximizes test throughput.
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Product
Memory Test Systems
T5503HS2
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Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
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Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Product
Compact Functional Test System
E2230C / TS-5040
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The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
PXI Solid-State Switch Module, 3xSPST, 25 A, 100 V, Hardware Interlock
40-184A-002-HI
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The 40-184A-002-HI has 3-off high current SPST switches with hardware interlock in one PXI slot and is part of our range of high power solid state switching solutions.
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Product
Switch Modules - 32 Two Pole Relays Arranged as Four Separate 8x1 Multiplexers
JX32/4(1x8)-2A
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This module has 32 two pole relays arranged as four separate 8x1 multiplexers as shown in the figure. The muxes may be operated and wired individually for up to 64 8x1's per chassis, or jumpered together to form 16x1's or 32x1's or jumpered to the backplane to form up to a 512x1 mux or two 256x1 muxes. It is available with Type A, Armature relays only.
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Product
PXI SPST Switch: 50-ch, 100Vrms/1A, Reed Relays
M9132A
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The M9132A is a high-density, general purpose switch with50 independent, single-pole, single-throw (Form A) switches in a single PXI module. This module can be used to cycle power to products under test, control indicator and status lights or actuate external power relays and solenoids. The high-speed, long-life reed relays can handle 100Vrms and 1A, with up to 25W power. Choose from the durable connector block or standard cable connections.
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Product
Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
PXI/PXIe RF Switch, Triple SPDT, 3GHz, 75Ω, MCX
42-830A-103
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The 40-830A-103 (PXI) and 42-830A-103 (PXIe) are 75Ω RF switches with 3 separate SPDT relays in a single slot. They have been designed to exhibit low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost. The switch banks have been carefully designed to ensure excellent and repeatable RF characteristics to frequencies of 3GHz with each path having a nominally equal insertion loss.
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
16-Ch SPST 10A-277VAC High Current
YAV90086
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16 power relays SPST Switching up to 2770VA 16A Switching 125Vac 10A Switching 277Vac CAN Control (or Ethernet with Ethernet to CAN Gateway) Drivers dll & VIs available
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Product
3-Axis Non-Robotic Automated Testing System
AT3
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The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
