Cohu, Inc.
We are a global leader in test handling, thermal subsystems, package inspection, contactors and MEMS test solutions used by the semiconductor industry. We provide our customers with outstanding products and services that reflect our commitment to operational excellence, innovation and market leadership. Delta Design's engineering and manufacturing plant Cohu, Inc. was founded in 1957 and is comprised of three business units, Delta Design, Rasco and Ismeca.
- 858.848.8000
- 858.848.8180
- info@cohu.com
- 12367 Crosthwaite Circle
Poway, CA 92064
United States
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product
Test Contactor
RF Scrub
RF Scrub™ Test Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range.The RF Scrub Test Contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.
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Kelvin Test Contactor
nano
nano Kelvin™ test contactor is a well-established Cantilever Kelvin test contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.Featuring a small imprint area, contact motion decoupled from the test board and simple and cost-efficient test boards.
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Kelvin Test Contactor
ecoAmp
ecoAmp™ Kelvin test contactor has a durable monolithic pin design with low and stable contact resistance. It is a high-power cantilever kelvin contactor with a patented spring and tip design for optimum heat dissipation. This ensures best reliability, long spring life and high yield even under highest current and temperature requirements. Featuring extended Automotive temperature range -60 ̊C to +175 ̊C, capable to stand thermal stress during high-power test. The contact motion is decoupled from the test board.
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MEMS And Sensor Test Automation Platform
Sense+
Sense+™ ultra-precise MEMS & sensor test automation platform allows for significant improvement in test accuracy, parallelism for a lower cost of test, and the ability to handle and inspect, small delicate sensors. Fully configured, Sense+ delivers a one-pass automated test, inspection, and metrology for the most complex MEMS devices including <1 mm WLCSP.
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Tri-Temp Pick-and-Place Handler
MT9510 XP / x16
MT9510 XP™/ MT9510 x16™ test handler provides full temperature control during test in extreme environmental conditions from -55˚C to +175˚C. A variety of options, upgrades and retrofits are available to configure the product to customer applications such as; automotive battery management systems (BMS) for electric (EV) and hybrid electric vehicles (HEV) and precision power regulators.
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MEMS Pressure Test
Cohu‘s well established pressure test equipment are providing high volume final test solutions for all pressure sensor markets.
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Gravity Test Handlers
Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.
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Test Contactor/Probe Head
Hydra
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
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Test Contactor
cDragon
cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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product
InCarrier Loader/Unloader
NY32-LU
NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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Air-Cooled Universal Test Platform
Diamondx
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Pick And Place Test Handlers
Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
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product
Kelvin Test Contactor
cCruiser
cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.cCruiser is the versatile solution for testing small discrete ICs. Its side-by-side Kelvin design is optimized for tri-temp capable insulation layer with extended Automotive temperature range -60°C to + 175°C. Contact socket is G-Pin footprint compatible with a contact spring wear out zone. Featuring conventional onboard socket contact mounting and 80 mΩ low and stable contact resistance. Denmark base material with various plating options, including pure Springs, LEDA, cGold and “state of the art” Thebe.