Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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Imaging Gauge Software Test System
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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Individual UPC Bar Code Standards
The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale from best to worse case characteristics of each parameter. With complete NIST traceable data supplied, it is ideally suited to those requiring traceability, such as ISO certification. Each symbol is individually calibrated to ANSI X3.182/ISO 15416 standards using a custom built microdensitometer. These cards are supplied calibrated for use with a 6 mil scan aperture and 660nm wavelength. (calibration wit other aperture sizes or wavelengths is available)
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Stage Micrometer Measuring Scales
The SM Series of Stage Micrometer Calibration Standards is ideally suited for calibrating optical, imaging, video as well as reticle based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Our SM series covers a range of low to high power systems, and can always be custom manufactured to perfectly fit your needs.
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ISO Test Charts
ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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Test Targets & Charts
APPLIED IMAGE is a world leader in the field of IMAGE EVALUATION Test Targets and Test Charts. Some of the specialized test charts include camera image evaluation ISO, NIST, ANSI, and MIL standard image evaluation applications; photonic and optophotonic applications; test charts for copiers and scanner; DATAcapture and BARcode Scanning testing; Security & Identification Image Capture; and all other type of imaging industries that require quality evaluation of thier image capture systems.
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Reticles / Graticules
With over 30 years experience in the manufacturing of high precision Custom and Standard Reticles for a wide range of applications, APPLIED IMAGE has gained a reputation for delivering precision and accuracy parts on time. Using our state of the art technology, our components are the most precise in the industry. Applications of this technology is useful in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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SINE M-6 Sinusoidal Array
The Sinusoidal Array SINE M-6 contains the same gray scales and sinusoidal areas as the M-5 but is arranged in a shorter and wider format, making it particularly useful when the complete array is to be imaged at one time.The overall size of the array is 70mm x 46mm; centered on an 8.5 inch (215mm) strip of 70mm film, which can also be mounted in glass (TM-G variations) at each modulation (-35, -60, -80).
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SINE M-5 Sinusoidal Array
The Sinusoidal Array SINE M-5 is made on a strip of 70mm film approximately 5.12 inches (130mm) in length.The upper row contains the sinusoidal areas with the spatial frequencies in cycles per mm. All sinusoidal areas are carefully oriented with respect to the others, and the lines at the left end of the array have been added for alignment purposes.
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NBS Targets
NBS Targets by Applied Image - NBS-1952 Resolution Test Chart, ANSI/ISEA Z87.1-2020 Test Resolution Standard
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Barcode Conformance Calibration Standards
Barcode symbol quality has been at the forefront of discussion among practitioners in the automatic identification and data capture (AIDC) industry since they were invented in 1951. Barcodes became commercially successful when they were used to automate checkout systems at grocery stores, with the very first scanning of the Universal Product Code (UPC) on a pack of Wrigley Company chewing gum in June 1974. The Uniform Code Council (UCC) published barcode quality guidelines, and ANSI X3.182-1990 became the first published standard for barcode quality. Since then, ISO/IEC 15416 for 1D symbols and ISO/IEC 15415 for 2D symbols have become the global standards for grading printed barcodes.
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O.E.M. Specific Test Charts
O.E.M. Specific Test Charts by Applied Image - IMATEST SFRPlus Chart, ISA ColorGauge Targets, ISA Device Level Target, ISA Object-Level Target Family, ISA Spatial Frequency Response Target
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Conformance Calibration Standard Test Card for UPC/EAN Symbol Verifiers
AI-CCS-UPC/EAN-E Rev S
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
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Optical Slits
The APPLIED IMAGE Optical Slit reticles are available in sizes from 10μm (0.01mm) to 1,000μm (1.0mm) widths, on either Chrome on Glass or Chrome on Opal material, with an overall size of 25.4mm (1.0 inch) diameter.
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SINE FBI Charts
There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.
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Reticles, Optical Slits, Optical Apertures
With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
