Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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Test Targets & Charts
APPLIED IMAGE is a world leader in the field of IMAGE EVALUATION Test Targets and Test Charts. Some of the specialized test charts include camera image evaluation ISO, NIST, ANSI, and MIL standard image evaluation applications; photonic and optophotonic applications; test charts for copiers and scanner; DATAcapture and BARcode Scanning testing; Security & Identification Image Capture; and all other type of imaging industries that require quality evaluation of thier image capture systems.
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AIIM Test Charts (Scanner/Microfilm/Digital/ Copier)
AIIM Test Charts (Scanner/Microfilm/Digital/ Copier) by Applied Image - Motion-Rotary Target, Planetary-Static Target, Small Area Target/AIIM MS-303-1980, Small Scanner Resolution Target , Copier Test Array, Rotary Test Target/AIIM X113, Film Strip Target, Eastman Kodak Copier/Scanner Digital Test Target, Small Color MTF Target
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IEEE Test Charts (Video /Cine)
IEEE Test Charts (Video /Cine) by Applied Image - IEEE Video Resolution Chart, Picture Height Test Chart, Microsoft WebCam Image Quality Test, OTTO-2 Otto Nemenz Cine Lens Calibration Reticle
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EIA Test Charts
EIA Test Charts by Applied Image - EIA Halftone Gray Scale Chart, EIA Video Resolution Pattern
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Standard Step Tablets, Gray Scales & Density Reference Charts
Standard Step Tablets, Gray Scales & Density Reference Charts are available in a wide variety of patterns, designs and sizes to fit a multitude of today’s application needs. Our gray scales and density patches are measured on a variety of NIST traceable instrumentation, including some of the most sophisticated microdensitometers available to the industry. They are imaged on either Photo Paper (RM) or Film (TM) to function for reflective or transmissive applications.
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O.E.M. Specific Test Charts
O.E.M. Specific Test Charts by Applied Image - IMATEST SFRPlus Chart, ISA ColorGauge Targets, ISA Device Level Target, ISA Object-Level Target Family, ISA Spatial Frequency Response Target
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O.E.M. Optical Standards
O.E.M. Optical Standards by Applied Image - Boston Scientific Checkerboard Array, Cognex Glass Calibration Plate Set
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Custom Test Targets & Charts
Our customers in industries that require camera or scanner image evaluation certainly know the challenges that come from finding the perfect target for a specific system and measurement. Thankfully, we at APPLIED IMAGE know these challenges just as well. The ability to freely customize a target has proved important for our customers to get the image evaluation tools they need. Our sales engineers are experts in different types of targets and specifications that will give you the best results for your project, and will guide you through the process from start to finish.
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Imaging Gauge Software Test System
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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SINE (Sinusoidal) Targets & Arrays
Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm, while the transmission film arrays are offered in various sizes up to 256 cycles per mm. In addition, the sinusoidal arrays are available in a Single Frequency Grating or with Multi-Frequency Gratings. If instead of continuous sinusoidal frequency, you are looking for a square wave frequency design, then look to the Ronchi Gratings page. Should you need to alter the size of the pattern or the substrate, fill out our Custom Test Targets and Charts form and start the conversation.
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SINE M-13-60 Sinusoidal Array
The Sinusoidal Array SINE M-13-60 is designed to be used for evaluating systems that work in the reflective mode such as scanners, machine vision systems and cameras. It is imaged on Photo Paper in four different sizes getting larger from 1X – 8X. The ½X and 1X slides incorporate the same spatial frequencies. Spatial frequencies for the 2X, 4X and 8X versions are 1/2, 1/4 and 1/8 respectively.
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Custom Barcodes
Verifier and scanner manufacturers often require custom barcodes for product evaluation, calibration, and quality control. Whether it’s a single code or a composite sheet of multiple codes, symbologies, minimum x dimension, etc., APPLIED IMAGE produces these custom, photo-composed standards to meet the needs of our global base of customers using our proprietary ACCUedge® technology.
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ACCUplace Dot Distortion Target
AP-DD Series
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Distortion target is designed to detect the presence of both barrel/pincushion distortion as well as alignment distortion that causes the keystone effect. The precise amount of distortion is determined from an array of precisely placed dots in a regular array. The results can be used to correct for any distortion that occurs within the optical system. The AP-DD is offered on three standard substrates; Chrome on Glass (CG) Opal (OP) and Photo Paper (RM).
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ISO Test Charts
ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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SINE FBI Charts
There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.