Langer EMV-Technik GmbH
Langer EMV-Technik GmbH is a medium-sized electro-technical company which is active in the field of electromagnetic compatibility-related
- +1 888 687 5 687
+49 (0) 351 430093-0 - +49 (0) 351 430093-22
- mail@langer-emv.de
- sales@langer-emv.de
- Nöthnitzer Hang 31
Bannewitz, D-01728
Germany
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Product
Measurement Technology for the Development Stage
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EMC tools for relative measurements of interference emission of assemblies and devices.
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Product
Near Field Micro Probe Sets
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The near field probe is designed for a high-resolution measurement of electrical near fields.
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Product
Near Field Micro Probes ICR HH H Field
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The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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Product
IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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Product
Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
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The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Product
Immunity
EFT coupling
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s used for direct-contact measurements of impulse immunity in IC pins, according to IEC 62215-3 and IEC 61000-4-4.
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Product
H-Field Burst Detector
BD 11
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The BD 11 is used to detect a burst or ESD current pulse on a cable, for example in a complex system. This makes it easier to investigate the causes of sporadic faults in the system. It is small and handy, its sensitivity is very high and continuously adjustable.
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Product
Immunity
ESD coupling
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is used for conducted coupling of Langer ESD pulses (200ps rise time) into ICs.
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Product
IC Measurement Technology
Emission
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is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins.
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Product
Line-impedance stabilisation network
NNB 21 set
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The NNB 21 line impedance stabilization network is designed for measuring of grid bound interferences of a device under test according to the satndard CISPR 25/ISO 7637. It measures the RF interference, which couples into the vehicle electrical system. Measurements during the development in a frequency range from 100 kHz to 1GHz can be carried out.
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Product
Optical signal transmission
Bus systems
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Allows for the transmission of high speed CAN signals via optical fibre cables during EMC tests or when there are great potential differences (high voltage).
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Product
Burst Detectors
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The Burst detector monitors interference threshold exceedances at cable-and line bundles. It selectively detects conducted disturbances, which would influence the monitored device.
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Product
Optical Signal Transmission
Analog
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Used for oscillographing analog signals under EFT/EDS/RF interference.
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Product
IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Product
Optical signal transmission
Digital
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The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
