Bruker microCT
Manufacture systems for microtomography, nontomography and non-invasive 3D X-ray microscopy.
- 32 3 877 5705
- 32 3 877 5769
- info.BmCT@bruker.com
- Kartuizersweg 3B
Kontich, 2550
Belgium
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Product
TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Product
Infrared, Near Infrared & Raman Spectroscopy
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Our selection of near, mid and far infrared and Raman spectrometers is unrivalled across the industry. Our portfolio includes compact, portable routine as well as powerful research spectrometers. Our solutions cover the entire spectral range from near infrared, mid infrared, far infrared to THz applications.
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Product
Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Product
Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Product
Mechanical Tester
UMT TriboLab
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Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.
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Product
Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Product
Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Product
Test & Measurement
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High-performance surface and dimensional analysis tools for industry and researchers
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Product
Electron Microscope Analyzer
QUANTAX EBSD
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QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM

















