FA Instruments
FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection in the visible to NIR range. We also manufacture “SIFT” Stimulus Induced Fault Testing systems.
- 510 851 5555
- 484 210 2961
- info@fainstruments.com
- 36217 Worthing Dr.
Newark, CA 94560
United States of America
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product
Microscopy Software Suite/IC Diagnostics
Crystal Vision
Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity.
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product
Parametric Analyzer
FA Instruments Parametric Analyzer offers all the functions of a 'big box' circuit testing solution, without the 'big box' footprint!The Parametric Analyzer is an advanced software module that can performs within the Crystalvision suite. The module provides all the functionality and testing schemes you would expect from a high-end solution, with all functionality being geared towards providing the maximum information to the FA engineer.
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product
Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
