JTAG Technologies Inc.
We are a solutions company specializing in PCB assembly testing, fault diagnosis and device programming. We develop innovative products built upon boundary-scan (IEEE Std 1149.x) standards and supply our software and hardware products and services world-wide.
- 877 FOR JTAG
+31 (0) 40 295 0870 - info@jtag.com
- Bogert 6
Eindhoven, 5612 LZ
Netherlands, Kingdom of the
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Product
JTAG Boundary-Scan Controller for PXI and PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37x7/PXI
Controller
High speed and performance JTAG Boundary-scan controller for PXI and PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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Product
Pod with Four Test Access Ports for 5v or 3.3V TTL Thresholds
JT 2137
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The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
eDAK For MAC Panel
JT 2147/eDAC for MAC Panel
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The JT 2147/eDAK is a new variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within a MAC Panel ‘Scout’ mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry plus four independent, programmable TAP modules (two of type JT 2149 and two of type JT2149/MPV) on a single board that matches the MAC Panel Direct Access Kit (DAK) form factor. Overall this configuration offers four Test Access Ports, 64 Digital IO Scan channels and reconfigurable (SCIL) capabilities
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Product
32 Channel Multi-Purpose DIOS/TAP Modules/Interfaces for Spare JT 2148 QuadPOD Transceiver Slot
JT 2149/MPV eMPV
Interface
The JT 2149/MPV and the JT 2149/eMPV are a 32 channel multi purpose DIOS/TAP pod modules/interfaces that can be plugged into any spare JT 2148 QuadPOD transceiver slot. The DIOS channels of these units I/O interface pods enable increased fault coverage and thus improved diagnostic resolution during boundary-scan testing. The principal difference between the two versions is the use of an extended case on the eMPV that allows standard 0.1″ connections to be used to access ths TAP and static IO signals (see tab below)- on the standard /MPV unit these signals are available at the front face 0.05″ connector. The units are fully supported by JTAG Technologies’ development tools. Additional DIOS modules can be serially connected if more parallel access points are required.
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Product
USB License Key
Sentinel RMS
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For customers that wish to use our software on different computers we offer the possibility to purchase our software license locked to a USB dongle. Add this product to your software order and we’ll deliver your software licenses linked to a compact Sentinel RMS license key.
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Product
Boundary-Scan Controller for PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37×7/PXIE
Controller
High speed and performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Product
JTAG Live Controller
Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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Product
JTAG Test Software
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JTAG Technologies software has been subject to a program of continuous development for over 20 years. The first products, launched in 1991 formed the start of our 'Classic' range of software and featured the first automatic boundary-scan test program generator (ATPG) for PCB interconnects plus associated test execution and diagnostics software. In 2006 JTAG Technologies launched it's new flagship tools platform JTAG ProVision.
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Product
64-Channel Boundary Scan Digital I/O Scan Module
JT 2111/MPV DIOS DIN
Digital I/O Module
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.This JT2111/MPV DIOS module is also available through our webshop.
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Product
ATE Integration
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Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Product
Digital/Analog/Frequency Measurement Module
JT 2149/DAF
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The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module for use in JTAG Technologies’ widely-used JT 2147 (QuadPod) signal conditioning interface. The DAF module has been designed to replace a regular TAP Pod and provides 28 measurement channels plus a clock generator. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
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Product
64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
Digital I/O Module
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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Product
CoreCommander
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While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
Children
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Corelis, Inc.
Corelis is a pioneer in the rapid development of innovative IEEE-1149.x-compliant products and services in support of the JTAG/boundary-scan market. As a result of our ingenuity and contributions to the industry, a growing number of customers have been able to incorporate boundary-scan technology into their product development processes in order to gain a competitive edge in today’s marketplace.
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DFT - MG-Products BV
DFT, Designed for Testing. is part of MG-Products and is specialized in the delivery of functional Testfixture solutions from both MG-products and 6TL. DFT also stands for Design For Test, perhaps the most important step in the development process of your product. DFT ensures that your product can be contacted and tested efficiently and reliably.
