Carl Zeiss AG
ZEISS is an international leader in the fields of optics and optoelectronics. ZEISS has been contributing to technological progress for more than 160 years – with solutions for the semiconductor, automotive and mechanical engineering industries, biomedical research and medical technology, as well as eyeglass lenses, camera and cine lenses, binoculars and planetariums.
- +49 800 9347733
- do-not-reply@zeiss.com
- Carl-Zeiss-Straße 22
Oberkochen, 73447
Germany
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Active Scanning Technology
ZEISS invented scanning in response to the drawbacks of single-point measurement nearly 50 years ago. This game-changing development enables the capture of thousands of data points within just a few seconds for truly reliable tactile quality assurance. It also saves time and money by delivering the high throughput and accurate results that are vital for manufacturing.
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EMC Testing
Does your product send or receive electromagnetic data? This can be analyzed using various tests. We investigate the interference immunity and emitted interference of simple electrical devices and complex machinery. Our EMC measurements and tests conducted in accordance with standards recognize all activity in the electromagnetic field and ascertain how immune to interference a piece of equipment is. We will also offer guidance on optimizing the product in terms of its EMC properties during the development phase.
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Software
Measuring, evaluation and management software enables you to increase the performance of all your metrology operations.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Inverted Microscope Platform
Axio Observer
In life sciences research you come up against new challenges every day. That’s why you want a flexible microscope system that can be tailored to your needs. ZEISS Axio Observer is your inverse platform for demanding multimodal imaging of living and fixed specimens. Combine Axio Observer with a wealth of technologies and refine it to support your experiments precisely.
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Spectrometer Modules
ZEISS Spectroscopy offers high-quality, robust, customer-driven spectrometer modules. Various optical design and detector options allow for OEM solutions tailored to your exact needs.
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Optical Metrology
Complex measurements can be performed quickly and easily with optical measuring solutions from ZEISS. With a high degree of automation and state-of-the-art sensors, they reduce operating errors and guarantee high measuring accuracy.
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Widefield Microscopes
Widefield microscopes are available in different versions. Choose an upright microscope if your task is to analyze zebrafish embryos, stained tissue selections or brain slices. For tissue culture and quick assessments in routine research, the inverted microscope might be the better choice.
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Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Microscope Cameras
In contrast to digital cameras for normal photography, microscope cameras are built to meet the demands of high-end science- and research applications. For maximum light sensitivity they use large CCD or CMOS sensors for image acquisition. Color reproduction is often critical, why features like Microscanning or Color-Co-Site Sampling ensure optimal image quality. Due to the lack of a light absorbing color filter monochrome microscope cameras for fluorescence imaging are even more sensitive.
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Shop Floor CMMs
Quality assurance should be performed at the site of production. This is how manufacturing errors can best be identified and even avoided in the best case scenario. We not only provide the answer to this customer requirement with our MaxLine, but are continuing to enhance it.
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X-ray Microscopy
ZEISS Xradia Versa
Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
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Correlative Microscopy
Our modular software platforms enable you to acquire, process and analyze images in multiple dimensions and over various timepoints
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Microscope Software
Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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GOM GmbH
GOM develops, produces and distributes software, machines and systems for industrial and automated 3D coordinate measuring technology and 3D testing based on latest research results and innovative technologies.
